Rohde & Schwarz at PCIM 2026

The new R&S®MXO-K333 3-phase power analysis option turns the MXO series oscilloscopes into a waveform analysis tool for in-depth AC power characterization. A guided-setup wizard automatically maps the oscilloscope’s eight channels to three voltage and three current probes, validates the wiring (2-wire, 3-wire or 4-wire: 2V2A, 3V3A, 3VN3A) and configures the scope. After the setup is complete, the software delivers per-cycle calculations of RMS values, power factor, active, reactive and total power, along with phasor/vector visualization. Harmonic and THD analysis complies with IEC 61000-3-2, presenting results through power-waveform views, harmonic spectra, FFT statistics and phasor diagrams. The original transient waveforms and trigger capabilities remain visible so that engineers can move beyond conventional statistical data to quickly trace root-causes in power-distribution networks, converters and industrial-power systems.

The LMG671 power analyzer delivers continuous, high-precision measurements for modern electric drivetrain systems. It calculates output-to-input efficiency while simultaneously monitoring the motor’s mechanical power via direct speed and toque sensing. Inverter output is examined in three bandwidths (fundamentals, harmonics and wideband power) to quantify high-frequency losses. All key readings and graphs are organized on a dedicated custom menu for an at-a-glance view of system performance. The LMG671 is now part of the Rohde & Schwarz power electronics portfolio, following the recent acquisition of ZES ZIMMER Electronic Systems GmbH.

In collaboration with PE-Systems, Rohde & Schwarz will demonstrate an automated double-pulse end-of-line (EOL) tester that improves consistency and efficiency in power electronics production. The solution links EOL verification with standards, such as AQG 324, to automatically evaluate switching behavior, static performance and short-circuit robustness. PE-Systems’ modular platform conducts both static and dynamic tests under realistic operating conditions directly on the line, minimizing human error, accelerating throughput and guaranteeing uniform quality. The demo unit uses the Rohde & Schwarz MXO 58C, a rack-optimized next-generation oscilloscope. Combined with the R&S®RT-ZISO module, the MXO 58C delivers stable, accurate double-pulse test for SiC and GaN devices in a fully automated EOL environment.