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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
531 Results
Assisting Tools for Operation of Windows-Based T&M Instruments
13-Jun-2013 | AN-No. 1MA218
27-May-2024 | Press Releases | Test & measurement
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM EuropeRohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.
11-Jun-2024 | Press Releases | Test & measurement
Rohde & Schwarz presents R&S RT-ZISO isolated probing system for precise measurements of fast switching signalsRohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.
A wide range of Signal Integrity solutions from Rohde & Schwarz ► Get more information!
06-Jun-2023 | Press Releases | Test & measurement
Automotive Testing Expo Europe 2023: Enabling the next level of ADAS with test & measurement solutions from Rohde & SchwarzAt Automotive Testing Expo Europe 2023 in Stuttgart, Rohde & Schwarz will demonstrate a wide range of cutting-edge test solutions that support automotive applications. With test solutions on show that cover automotive radar, Ethernet, 5G and UWB, the company enables the automotive industry to make the next level of autonomous driving reality.
This application note introduces the IVI High Speed LAN Instrument Protocol (HiSLIP) and outlines its features. HiSLIP is the successor to the VXI-11 LAN remote control protocol. This document also describes guidelines for using this protocol.
12-Nov-2014 | AN-No. 1MA208
01-Oct-2024 | Press Releases | Test & measurement
Rohde & Schwarz showcases its cutting-edge test solutions for consumer electronics at CETEX 2024 in AmsterdamRohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.
Explore particle acceleration solutions from test and measurement experts. Trust our industry-leading equipment to meet particle accelerator test requirements.
06-Mar-2025 | Press Releases | Test & measurement
Rohde & Schwarz revolutionizes EMC Testing at EMV 2025: Unveiling innovative T&M solutions for a connected worldRohde & Schwarz is set to present a comprehensive suite of EMC and field strength test equipment at the EMV show 2025 in Stuttgart from March 25 to 27, 2025. The display will include standalone instruments, software, and systems designed to meet various industry standards. The solutions support commercial, automotive, military and aerospace standards, as well as ETSI and FCC standards. Visitors can witness these innovative demonstrations at booth number 615.
06-Jun-2024 | Press Releases | Wireless communications
Rohde & Schwarz and VIAVI offer joint network test solutions supporting Open Radio Commercialization and InnovationThe United States Department of Commerce will provide funding to promote the deployment of open networks in the U.S. and abroad. Rohde & Schwarz and VIAVI offer joint test solutions to meet the needs of radio equipment manufacturers who plan to apply for the funding.
13-Feb-2025 | Press Releases | Test & measurement
Rohde & Schwarz showcases its advanced test solutions for embedded systems at embedded world 2025Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the embedded world, to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.
22-May-2025 | Press Releases | Test & measurement
Zurich Instruments and Rohde & Schwarz to back the National Quantum Computing Testbed Facility in AustraliaZurich Instruments, a market leader in developing and marketing qubit control and readout electronics for quantum computers, and its parent company Rohde & Schwarz, have been selected as key partners in the National Quantum Computing Testbed Facility (NQCT) project in Queensland, Australia.
R&S RT-Zxx High Bandwidth Probes - Specifications
Learn how to debug serial protocols with an oscilloscope. Explore the most common types of serial protocols, such as UART, (Q)SPI, I2C and CAN bus.
I want to export the waveform data of my RTO scope into MATLAB, but the only way I found so far is the screenshot option. Is there another way to use the trace data in my script?
26-Mar-2024 | Press Releases | Test & measurement
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
The R&S®RTO Oscilloscope supports the acquisition and the detailed signal analysis of these signals by using the history mode. The history mode allows the user to look back to previous acquisitions and apply the wide set of analysis functions of the RTO.
03-Jun-2013 | AN-No. 1TD02
This application note introduces the working principles of a conventional trigger system and explains the advantages of the real-time capable digital trigger of the RTO oscilloscopes.
11-Apr-2012 | AN-No. 1ER04
Oscilloscopes that fit your requirement and your budget, from value to high performance. Rohde & Schwarz oscilloscopes offer excellent signal fidelity, high acquisition rate, an innovative trigger system and an innovative user interface. Choose the right promotion for you and save time and money!
Describes the test procedures to perform DDR3 compliance tests.
Describes the test procedures to perform eMMC compliance tests.
Describes the test procedures to perform D-PHY compliance tests.
Describes the R&S®ScopeSuite Automation option.
This application note presents the Jitter analysis capabilities of the R&S®RTO for digital signals. It demonstrates the basic operation with an application example, and shows the associated jitter analysis.
29-Aug-2013 | AN-No. 1TD03
Describes the test procedures to perform USB 2.
Provides information on security issues when working with R&S®RTO6 in secure areas.
Provides information on security issues when working with R&S®RTO2000 in secure areas.
Describes the test procedures to perform PCIe 1.
This application note explains the background of blind time and points out why a high acquisition rate is important. It furthermore explains the R&S RTO oscilloscope capabilities and how they help for faster debugging, measurement and analysis.
17-May-2011 | AN-No. 1ER02
RTO / RTP Firmware Update from an older Version