3 Results
Open test platform for high-performance ATE applications
The R&S®CompactTSVP concept represents true innovation in state-of-the-art PC based instrumentation while offering traditional capabilities found in high-performance ATE systems. The versatile platform accelerates the adoption of CompactPCI and PXI in all major fields of industrial test and measurement applications
Three models for the test system versatile platform, including rear I/O module