409 Results
27-May-2024 | Press Releases
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM EuropeRohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.
06-Jun-2023 | Press Releases
Automotive Testing Expo Europe 2023: Enabling the next level of ADAS with test & measurement solutions from Rohde & SchwarzAt Automotive Testing Expo Europe 2023 in Stuttgart, Rohde & Schwarz will demonstrate a wide range of cutting-edge test solutions that support automotive applications. With test solutions on show that cover automotive radar, Ethernet, 5G and UWB, the company enables the automotive industry to make the next level of autonomous driving reality.
This application note introduces the IVI High Speed LAN Instrument Protocol (HiSLIP) and outlines its features. HiSLIP is the successor to the VXI-11 LAN remote control protocol. This document also describes guidelines for using this protocol.
12-Nov-2014 | AN-No. 1MA208
01-Oct-2024 | Press Releases
Rohde & Schwarz showcases its cutting-edge test solutions for consumer electronics at CETEX 2024 in AmsterdamRohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.
06-Mar-2025 | Press Releases
Rohde & Schwarz revolutionizes EMC Testing at EMV 2025: Unveiling innovative T&M solutions for a connected worldRohde & Schwarz is set to present a comprehensive suite of EMC and field strength test equipment at the EMV show 2025 in Stuttgart from March 25 to 27, 2025. The display will include standalone instruments, software, and systems designed to meet various industry standards. The solutions support commercial, automotive, military and aerospace standards, as well as ETSI and FCC standards. Visitors can witness these innovative demonstrations at booth number 615.
06-Jun-2024 | Press Releases
Rohde & Schwarz and VIAVI offer joint network test solutions supporting Open Radio Commercialization and InnovationThe United States Department of Commerce will provide funding to promote the deployment of open networks in the U.S. and abroad. Rohde & Schwarz and VIAVI offer joint test solutions to meet the needs of radio equipment manufacturers who plan to apply for the funding.
13-Feb-2025 | Press Releases
Rohde & Schwarz showcases its advanced test solutions for embedded systems at embedded world 2025Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the embedded world, to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.
26-Mar-2024 | Press Releases
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
I want to export the waveform data of my RTO scope into MATLAB, but the only way I found so far is the screenshot option. Is there another way to use the trace data in my script?
R&S® RTO 示波器數位觸發技術優點技術應用文章
The R&S®RTO Oscilloscope supports the acquisition and the detailed signal analysis of these signals by using the history mode. The history mode allows the user to look back to previous acquisitions and apply the wide set of analysis functions of the RTO.
03-Jun-2013 | AN-No. 1TD02
This application note introduces the working principles of a conventional trigger system and explains the advantages of the real-time capable digital trigger of the RTO oscilloscopes.
11-Apr-2012 | AN-No. 1ER04
Rohde & Schwarz Manual for eMMC Compliance Tests. Describes the test procedures.
Rohde & Schwarz User Manual for DDR3 Compliance Test. Describes the test procedures.
Rohde & Schwarz Manual for ScopeSuite Automation option. Describes the test procedures.
R&S RTO/R&S RTP USB 2.0/3.2 Compliance Test User Manual. The user manual describes the USB 2.0 compliance test procedures.
This application note presents the Jitter analysis capabilities of the R&S®RTO for digital signals. It demonstrates the basic operation with an application example, and shows the associated jitter analysis.
29-Aug-2013 | AN-No. 1TD03
Rohde & Schwarz User Manual for D-PHY Compliance Tests. Describes the test procedures.
Instrument Security Procedures for R&S® RTO6
Instrument Security Procedures for R&S® RTO2000
Rohde & Schwarz User Manual for PCI Express 1.1/2.0/3.0 Compliance Test. Describes the test procedures.
This application note explains the background of blind time and points out why a high acquisition rate is important. It furthermore explains the R&S RTO oscilloscope capabilities and how they help for faster debugging, measurement and analysis.
17-May-2011 | AN-No. 1ER02
WEB control is not working with the RTO.
RTO / RTP Firmware Update from an older Version
Connection of R&S ScopeSuite to RTO/RTP fails
Number of harmonics, RTE, RTO, Power option, FAQ
Rohde & Schwarz User Manual for Ethernet Compliance Test. Describes the test procedures.
At startup of RTE/RTO/RTP Windows asks for user and password. How can I get back the autologon function?
RTO/RTP Setup of Reference Levels for Measurements in Firmware Version 5