By reference to settings and measurements with a vector network analyzer R&S®ZNA we are demonstrating the de-embedding process of a PCIe5 connector integrated in a test fixture. By reference to settings and measurements with a vector network analyzer R&S®ZNA we are demonstrating the de-embedding process of a PCIe5 connector integrated in a test fixture.

with the R&S®ZNA.

Video, ZNA, Intermodulation Measurements on an Amplifier This video shows how to perform intermodulation measurements on devices under test, in this case an amplifier, on the R&S®ZNA.

Load Pull, VNA, ZNA, Vector Receiver, Tuner, device characterization The combination of Maury Microwave Tuners plus IV CAD software with the R&S ZNA vector network analyzer makes vector receiver load pull measurements easy.

19-Jul-2022 | Press Releases | Test & measurement

Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.

Class-leading mobile network infrastructure testing solutions to address various needs and to enable the opportunities of 5G. Learn more.

In this final video we look at a special mode of measurements where the ZNA network analyzer can be used to analyze the pulse in time to study in much higher resolution what is happening during the “on time” of the RF pulse. ZNA, Pulse Fundamentals Making pulsed measurements with a vector network analyzer

Choose Rohde & Schwarz test solutions for mixers & frequency converters for dynamic range, ease of operation and phase noise performance reasons.

R&S®ZNA Vector Network Analyzers - Media center

Powerful solutions for testing high-speed digital interfaces: verification ✓ debugging ✓ and compliance testing ► Get more information!

14-Aug-2025 | Press Releases | Test & measurement

Rohde & Schwarz invites attendees to EuMW 2025 in Utrecht to “Discover the next wave of test and measurement” at booth A026 in the Jaarbeurs Utrecht. A key highlight of the exhibition will be the game-changing FSWX signal and spectrum analyzer.

Calibration of two channels simultaneously with remote commands

I have an existing limit line. Is it possible to apply a vertical offset?

Is there a way to query the data of all traces at once?

Is it possible to automatically restart a ZNB with return of the AC power?

Export complex data of a trace with mathematics and time gating.

VNA - do I really need a sliding match for calibration?

13-Jan-2022 | Press Releases | Test & measurement

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.

26-Mar-2024 | Press Releases | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

Active cal kit or cal unit does not contain all standards needed for selected cal procedure.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

Provides the information required to prepare the instrument for use and start working.

I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?

Explore material characterization techniques and applications. Discover impedance analyzers and other material characterization equipment from an industry leader.

I have a file on my device. How can I get it in a simple way to my PC?

I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?

How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?

Explore comprehensive DDR testing solutions from Rohde & Schwarz for signal integrity and compliance testing across all generations of DDR technology.

Rohde & Schwarz simplifies the challenging and extensive task of characterizing active components such as RF power amplifiers and RF frontends.

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.