I have an existing limit line. Is it possible to apply a vertical offset?

Is there a way to query the data of all traces at once?

Is it possible to automatically restart a ZNB with return of the AC power?

Export complex data of a trace with mathematics and time gating.

VNA - do I really need a sliding match for calibration?

13-Jan-2022 | Press Releases | Test & measurement

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.

Active cal kit or cal unit does not contain all standards needed for selected cal procedure.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

Explore material characterization techniques and applications. Discover impedance analyzers and other material characterization equipment from an industry leader.

Provides the information required to prepare the instrument for use and start working.

I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?

I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?

I have a file on my device. How can I get it in a simple way to my PC?

How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.

Enhance your knowledge. With the Rohde & Schwarz webinar series on satellite testing.

Listing of all video overview pages sorted by categories and themes. Looking for additional insight on a specific application or measurement technique? Pick your topic of interest.

For the demanding measurements, the high-end R&S®ZNA vector network analyzer, R&S®ATS800B and R&S®ATS800R compact antenna test ranges (CATR) are used.

Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.

Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.

Rohde & Schwarz simplifies the challenging and extensive task of characterizing active components such as RF power amplifiers and RF frontends.

03-Sep-2024 | Press Releases | Test & measurement

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

21-Mar-2022 | Press Releases | Test & measurement

At DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.

Choose Rohde & Schwarz signal and power integrity test solutions for the best application fit thanks to time and frequency considerations.

Early wafer-level qualification of RF components ensures quality and saves money

14-Jul-2022

On-wafer characterization at sub-THz frequencies

12-Dec-2023

Maximizing power amplifier efficiency with harmonic load pull measurements

17-Apr-2023

Essential cost consideration

Instrument health guide for vector network analyzers | Pour les analyseurs de réseaux vectoriels - Flyer Brochures and Data Sheets Flyer

Choose Rohde & Schwarz test solutions for power amplifier efficiency optimization for their dual path signal generation capabilities and ease of results analysis.