High-Speed-Digital webinars

Webinar: Measurement of Wide Bandgap Power Devices

This webinar offers a detailed exploration of the challenges in measuring Wide-Bandgap (WBGT) power devices, illustrated with practical examples. It covers the key measurement methods, equipment, and probes necessary for accurately capturing all relevant signals.

Energy conversion, from generation to consumption, involves multiple transformations, each with unique challenges. As the demand for efficient energy transmission grows, new semiconductor technologies like Gallium Nitride (GaN) and Silicon Carbide (SiC) are being developed to meet these needs. These Wide-Bandgap (WBGT) technologies provide higher switching frequencies, reduced power losses, and enhanced transmission capabilities.

However, these advancements also introduce new challenges in measurement. This session will delve into the measurement techniques and best practices essential for characterizing transistor switching circuits, including critical current and voltage measurements on the high-side transistor of a WBGT power system.

In this webinar, you will learn more about:

• Selecting differential high‑voltage probes with high bandwidth and excellent common‑mode rejection ratio so you can capture precise gate‑source and shunt‑current signals on high‑side switches.
• De‑skewing voltage and current probes to time‑align their signals and guarantee trustworthy dynamic‑power calculations.
• Recognizing and mitigating layout‑ and probe‑induced parasitics that introduce ringing, overshoot, and other waveform distortions.
• Applying proven measurement best practices that convert these techniques into clean, reliable data for wide‑bandgap power designs.