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19-Jul-2022 | Press Releases

Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.

In this final video we look at a special mode of measurements where the ZNA network analyzer can be used to analyze the pulse in time to study in much higher resolution what is happening during the “on time” of the RF pulse. ZNA, Pulse Fundamentals Making pulsed measurements with a vector network analyzer

Calibration of two channels simultaneously with remote commands

I have an existing limit line. Is it possible to apply a vertical offset?

Export complex data of a trace with mathematics and time gating.

Is it possible to automatically restart a ZNB with return of the AC power?

Is there a way to query the data of all traces at once?

VNA - do I really need a sliding match for calibration?

13-Jan-2022 | Press Releases

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.

Active cal kit or cal unit does not contain all standards needed for selected cal procedure.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

Provides the information required to prepare the instrument for use and start working.

I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?

I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?

I have a file on my device. How can I get it in a simple way to my PC?

How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?

26-Mar-2024 | Press Releases

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.

21-Mar-2022 | Press Releases

At DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.

This document provides the technical specifications of the R&S®ZN-ZCG comb generator.

Maximizing power amplifier efficiency with harmonic load pull measurements

17-Apr-2023

Early wafer-level qualification of RF components ensures quality and saves money

14-Jul-2022

On-wafer characterization at sub-THz frequencies

12-Dec-2023

Instrument health guide for vector network analyzers | Pour les analyseurs de réseaux vectoriels - Flyer Brochures and Data Sheets Flyer

Essential cost consideration

03-Sep-2024 | Press Releases

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

23-May-2023 | Press Releases

At IMS2023, Rohde & Schwarz is set to exhibit a range of live demos that showcase the cutting-edge developments within the industry. IMS attendees will also have the opportunity to participate in the interactive "Are you a genius?" RF Design challenge, putting their knowledge to the test at the Rohde & Schwarz booth.

ZNA, Average Pulse Measurements Making pulsed measurements with a vector network analyzer

ZNA, Point-In-Pulse Measurements Making pulsed measurements with a vector network analyzer

This paper investigates the evaluation complexities and importantce of PAM-4 interconnects at high data rates.

22-Oct-2020 | AN-No. GFM355