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This application note describes in detail the steps required to make a noise figure measurement on a spectrum analyzer using the “Y Factor” technique. Background equations are presented for each step of the calculation.

25-Jul-2012 | AN-No. 1MA178

This document provides an introduction to SDR as used for military radios and presents the relevant T&M solutions offered by Rohde & Schwarz.

15-Sep-2012 | AN-No. 1MA206

This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.

R&S®FS-K40 Application Firmware for Phase Noise Measurements - Data Sheet

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R&S®FS-K40 Application Firmware for Phase Noise Measurements - Data Sheet

R&S®FS-K40 Application Firmware for Phase Noise Measurements - Data Sheet DE

R&S®FS-K40 Application Firmware for Phase Noise Measurements - Data Sheet RU

This document provides the technical specifications of the R&S®NRP-Zxx power sensors

Active, high-impedance probes can be connected to spectrum analyzers, providing a practical and highly precise measurement solution to overcome an otherwise cumbersome RF testing issue. This application note provides information on how to use oscilloscope probes in RF measurements using spectrum analyzers

04-Jul-2023 | AN-No. 1EF116

R&S®FSQ-K70 Vektorsignalanalysator - Specifications

R&S VSE-K70x/FSx-K70x/FPx-K70x Vector Signal Analysis Application - Specifications

R&S VSE-K7/Fxx-K7/RTO AM/FM/PM Modulation Analysis - Specifications

Development Hints and Best Practices for Using Instrument Drivers

01-Jan-2013 | AN-No. 1MA153

This application note outlines two different approaches for remote-controlling Rohde & Schwarz instruments out of MathWorks MATLAB.

12-Jun-2017 | AN-No. 1MA171