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24-Apr-2025 | Press Releases

Video Electronics Standards Association (VESA) has officially approved Rohde & Schwarz test solutions for testing DisplayPort technology. This achievement reinforces the company’s commitment to delivering high-quality solutions for testing of the physical layer compliant with various industry standards.

The digital trigger of the R&S®RTP combined with the zone trigger offers versatile and flexible triggering capabilities for DDR memory interface measurements.

26-Sep-2018

It is recommended to use jitter measurement instruments for both the time and frequency domain in order to differentiate between fast and slow moving artifacts.

22-Aug-2017

Boost your bandwidth Sales - Flyer

LTE beamforming can be accurately tested with one or more R&S®RTO digital oscilloscopes for a 1×2, 1×4 or even a 1×8 MIMO system.

08-Aug-2024

Learn about how Rohde & Schwarz and Eurofins Digital Testing bring advanced testing kit to high speed interface compliance test programs.

Thanks to their multichannel capability, oscilloscopes are ideal for multichannel applications such as the analysis of MIMO, multi-antenna radar and differential high-speed digital signals.

06-May-2020

Verifying power integrity for DDR memories - The R&S ® RT-ZPR20 power rail probe is a specialized oscilloscope probe for very low-noise measurements on power.

05-Apr-2017

Versatile Software Tool for Rohde & Schwarz Instruments

RSCommander is a versatile software tool for a wide range of Rohde & Schwarz spectrum-, network analyzers, signal generators and oscilloscopes. It allows for automatic instrument discovery, making screenshots, reading traces, file transfer and simple script creation.

24-Dec-2017 | AN-No. 1MA074

For system verification and debugging, eye diagram measurements are the most important tools for efficiently analyzing the signal integrity in any digital design

19-Feb-2019

This application note describes two test solutions from R&S® to cope with the 5G FR1 downlink MIMO signal analysis challenges either using R&S®RTP/RTO oscilloscope or R&S®NRQ6 frequency selective power sensor.

26-Jun-2020 | AN-No. GFM343

The application fields of oscilloscopes extend to EMI debugging because of their powerful and easy-to-use FFT analysis capabilities– and save time and money.

23-Sep-2019

This application note describes Battery Life Measurements with the R&S®RT-ZVC02/04 Multi-Channel Probe. The measurements are described with the use of an oscilloscope.

17-Jan-2019 | AN-No. 1TD07

28-Oct-2024 | Press Releases

Test and measurement technology leader Rohde & Schwarz with decades of expertise is set to showcase at electronica 2024, held in its home city Munich. Visitors will be able to experience the company’s wide range of solutions designed to help them tackle their test and measurement challenges in the development, verification and production of electronic components and devices – from the everyday to the extraordinary.

R&S®RT-Zxx Oscilloscope Adapters - Specifications

20-Dec-2024 | Press Releases

Rohde & Schwarz has collaborated with Analog Devices, Inc. (ADI) to create a wide range of tests for Gigabit Multimedia Serial Link (GMSL) devices. The GMSL technology from ADI provides a cost-efficient, scalable, and simple SerDes solution designed to improve performance for high-speed video links, primarily used in In-Vehicle Infotainment (IVI) and Advanced Driver-Assistance Systems (ADAS) in vehicles. The collaboration will enable engineers, developers and manufacturers to create and deploy GMSL-based ADAS and IVI systems rapidly.

Read this application card to learn more about what the 10BASE-T1S Ethernet compliance test offers and how it ensures reliable operation and functionality.

15-May-2020

06-May-2025 | Press Releases

Rohde & Schwarz hosts the RF Testing Innovations Forum 2025, taking place online over two days, providing a virtual platform for RF design engineers to enhance their RF expertise and engage with industry leaders at the forefront of innovation.

R&S RT-Zxx Standard Probes - Specifications

R&S RT-Zxx High Bandwidth Probes - Specifications

19-Sep-2024 | Press Releases

Rohde & Schwarz is showcasing a proof-of-concept for a system for 6G wireless data transmission based on a photonic THz communications link at EuMW 2024 in Paris. The ultra-stable, tunable THz system is based on frequency comb technology and enables carrier frequencies well beyond 500 GHz.

13-Feb-2025 | Press Releases

Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the embedded world, to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.

03-Sep-2024 | Press Releases

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

Instrument Security Procedures for R&S® RTP

11-Aug-2022 | Press Releases

Advantest Corp. with headquarters in Chiyoda-ku, Tokyo, Japan, has selected the R&S RTP high-performance oscilloscope for mass production evaluation of high speed SoC testers. The R&S RTP is part of Advantest's continuous efforts to improve quality and was a key factor in updating the company’s verification environment to meet latest requirements. The decision for Rohde & Schwarz indicates that the long-term relationship between Advantest and Rohde & Schwarz will continue.

RTO / RTP Firmware Update from an older Version

Rohde & Schwarz User Manual for DisplayPort compliance tests

07-Jun-2022 | Press Releases

Rohde & Schwarz has paired the outstanding performance of its established R&S RTP oscilloscope with an enhanced user interface and a larger display. The result is an even more flexible oscilloscope in a compact format with a modern look and feel that continues to deliver high-performance signal integrity in real time.

At startup of RTE/RTO/RTP Windows asks for user and password. How can I get back the autologon function?

RTO/RTP Setup of Reference Levels for Measurements in Firmware Version 5