The R&S®LCX LCR meters are versatile, extremely accurate and perform measurements quickly.

Models: R&S®LCX100, R&S®LCX200

The R&S®LCX LCR meters are versatile, extremely accurate and perform measurements quickly. They are ideal for challenging applications in research, development and production. Two instrument models and various options cover applications with a test signal frequency of up to 10 MHz. Internal and external bias functions, comprehensive analysis options and versatile test fixtures expand the wide range of possible applications.

Discover basic measurement instruments for every workbench. Explore our selection of digital multimeters, LCR meters, impedance analyzers and power analyzers.

Calculation tool to determine the measurement accuracy of LCX100 and LCX200.

11-May-2023 | AN-No. 1GP138

The LCR meters R&S®LCX100 and R&S®LCX200 precisely measure the complex impedance and the resulting components values over a wide frequency range.

14-Mar-2022 | AN-No. 1GP132

Useful tips and tricks for your first measurement experience

Resistors, capacitors and inductors are the most basic components in electric circuits. It must be ensured that they work properly and accurately. Therefore, they need to be tested thoroughly during circuit design. This is usually done using LCR meters, which have become indispensable in the lab and in production. This application note looks at how to perform basic capacitor and inductor measurements accurately and reliably.

22-Feb-2024 | AN-No. 1GP142

This application note applies to DC power supplies R&S®NGL200, R&S®NGM200, R&S®NGP800, R&S®NGU201 and R&S®NGU401, as well as LCR meters R&S®LCX100 and R&S®LCX200.

19-May-2022 | AN-No. 1GP135

Webpage, VNC and FTP for Rohde & Schwarz DC power supplies and R&S®LCX LCR meters

27-Apr-2023

Models: R&S®LCX100, R&S®LCX200

The R&S®LCX LCR meter is ideal for measuring these dependencies.

17-Mar-2022

A high frequency transformer is a key component when designing isolated switching mode power supplies (SMPS). Leakage inductance is essential in the control of many design parameters including efficiency, maximum voltage rating for switching elements and EMI when it comes to designs using customized transformers. Accurate measurement of this parasitic element is mandatory. The R&S®LCX LCR meter is ideal for this challenging measurement task.

15-Feb-2022

R&S®LCX200 with R&S®LCX-K201 frequency upgrade - Fact Sheet Brochures and Data Sheets

R&S®LCX - EU Declaration of Conformity

R&S®LCX LCR表功能多样，能够非常准确快速地执行测量。此设备非常适合具有挑战性的研发和生产应用。

R&S®LCX LCR 錶功能多樣，能夠非常準確快速地執行量測。此設備非常適合具有挑戰性的研發和生產應用。LCR 錶提供兩種儀器型號和多種選配，測試訊號頻率高達 10 MHz，可用於廣泛的應用。內部和外部偏置功能、豐富全面的分析選配和多功能測試治具進一步擴展了儀器適用的應用範圍

R&S®LCX LCR Meter - Data Sheet Brochures and Data Sheets Datasheet

R&S®LCX LCR Meter | LCR-Meter - Datenblatt Brochures and Data Sheets Datasheet

R&S®LCX LCR Meter | LCRメータ - Data Sheet Brochures and Data Sheets Datasheet

R&S®LCX LCR Meter | LCR-измеритель - Data Sheet Brochures and Data Sheets Datasheet

R&S®LCX LCR Meter | Pont RLC - Data Sheet Brochures and Data Sheets Datasheet

R&S®LCX LCR Meter | Misuratore LCR - Data Sheet Brochures and Data Sheets Datasheet

R&S®LCX200 versus Hioki IM3536 - Comparison Sheet Brochures and Data Sheets

​Accuracy estimation for R&S®LCX LCR meters - White Paper Brochures and Data Sheets White Paper

R&S®LCX LCR Meter | Medidor LCR - Data Sheet Brochures and Data Sheets Datasheet

R&S®LCX100 versus Keysight E4980AL-032 - Comparison Sheet Brochures and Data Sheets

R&S®LCX200 versus Keysight E4980A - Comparison Sheet Brochures and Data Sheets

R&S®LCX200 versus Keysight E4980AL-052 - Comparison Sheet Brochures and Data Sheets

Learn about the differences between LCR meters and VNAs. Learn how to measure impedance with a network analyzer and how LCR meter impedance measurement works.

29-Apr-2025 | Press Releases | Test & measurement

Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.