The R&S®LCX LCR meters are versatile, extremely accurate and perform measurements quickly.

The LCR meters R&S®LCX100 and R&S®LCX200 precisely measure the complex impedance and the resulting components values over a wide frequency range.

14-Mar-2022 | AN-No. 1GP132

This application note applies to DC power supplies R&S®NGL200, R&S®NGM200, R&S®NGP800, R&S®NGU201 and R&S®NGU401, as well as LCR meters R&S®LCX100 and R&S®LCX200.

19-May-2022 | AN-No. 1GP135

​Accuracy estimation for R&S®LCX LCR meters - White Paper Brochures and Data Sheets White Paper

The R&S®LCX LCR meters are versatile, extremely accurate and perform measurements quickly. They are ideal for challenging applications in research, development and production. Two instrument models and various options cover applications with a test signal frequency of up to 10 MHz. Internal and external bias functions, comprehensive analysis options and versatile test fixtures expand the wide range of possible applications.

Models: R&S®LCX100, R&S®LCX200

Models: R&S®LCX100, R&S®LCX200

Calculation tool to determine the measurement accuracy of LCX100 and LCX200.

11-May-2023 | AN-No. 1GP138

Provides information on security issues when working with the R&S®LCX LCR meter in secure areas.

Discover basic measurement instruments for every workbench. Explore our selection of digital multimeters, LCR meters, impedance analyzers and power analyzers.

The R&S®LCX LCR Meters come with a high-resolution touchscreen, a maximum frequency of up to 10 MHz, versatile measurement functions, and logging capabilities The R&S®LCX LCR Meters come with a high-resolution touchscreen, a maximum frequency of up to 10 MHz, versatile measurement functions, and logging capabilities LCX, component testing, LCX100, R&S®LCX200, Key features The R&S®LCX LCR Meters come

Useful tips and tricks for your first measurement experience

Resistors, capacitors and inductors are the most basic components in electric circuits. It must be ensured that they work properly and accurately. Therefore, they need to be tested thoroughly during circuit design. This is usually done using LCR meters, which have become indispensable in the lab and in production. This application note looks at how to perform basic capacitor and inductor measurements accurately and reliably.

22-Feb-2024 | AN-No. 1GP142

The R&S®LCX-Z5 test fixture is designed for measuring transformers in combination with the measurement functions of the R&S®LCX LCR meters. The R&S®LCX-Z5 test fixture is designed for measuring transformers in combination with the measurement functions of the R&S®LCX LCR meters. Transformer Testing, R&S®LCX200 and R&S®LCX-Z5 Transformer Testing With R&S®LCX200 and R&S®LCX-Z5

Describes all instrument functions and remote control commands, including measurement and programming examples.

15-Mar-2022 | Press Releases | Test & measurement

With a completely new family of high performance LCR meters, the frequency range of impedance measurements provided by Rohde & Schwarz test equipment is dramatically extended to cover AC components operating from 4 Hz to 10 MHz, supporting all practical applications. The R&S LCX family of LCR meters serves all established impedance measurements plus specialized measurements for selected component types and provides both, the high accuracy required in R&D, and the high speed needed in production test and quality assurance.

LCX, LCR, sweep tool The sweep tool for the R&S®LCX LCR meters allows dynamic impedance measurements by sweeping test signal frequency, level, and DC bias.

LCX, component testing, LCX-K108 Extended bias functions The R&S®LCX-K108 option allows the user to apply an external DC voltage bias of up to 10V and an internal DC current bias of up to 200mA to the DUT.

The top class in component testing

Webpage, VNC and FTP for Rohde & Schwarz DC power supplies and R&S®LCX LCR meters

27-Apr-2023

The R&S®LCX LCR meter is ideal for measuring these dependencies.

17-Mar-2022

R&S®LCX200 with R&S®LCX-K201 frequency upgrade - Fact Sheet Brochures and Data Sheets

A high frequency transformer is a key component when designing isolated switching mode power supplies (SMPS). Leakage inductance is essential in the control of many design parameters including efficiency, maximum voltage rating for switching elements and EMI when it comes to designs using customized transformers. Accurate measurement of this parasitic element is mandatory. The R&S®LCX LCR meter is ideal for this challenging measurement task.

15-Feb-2022

R&S®LCX200 versus Hioki IM3536 - Comparison Sheet Brochures and Data Sheets

R&S®LCX200 versus Keysight E4980A - Comparison Sheet Brochures and Data Sheets

R&S®LCX100 versus Keysight E4980AL-032 - Comparison Sheet Brochures and Data Sheets

R&S®LCX - EU Declaration of Conformity

R&S®LCX200 versus Keysight E4980AL-052 - Comparison Sheet Brochures and Data Sheets

26-Mar-2024 | Press Releases | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

05-May-2022 | Press Releases | Test & measurement

The power electronics community will come together again at PCIM Europe in Nuremberg from May 10 to 12, 2022. Rohde & Schwarz is joining to demonstrate its latest test solutions for developers of power supplies and other power electronics. The company’s experts share their know-how about applications like stability analysis, power integrity and component testing as well as EMI debugging and EMI precompliance testing at the Rohde & Schwarz booth 452 in hall 7.

29-Apr-2025 | Press Releases | Test & measurement

Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.