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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
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The R&S®ZNA high-end vector network analyzers offer a DUT-centric approach, an excellent RF-performance, a unique hardware concept and touch-only operation.
The FFT-based spectrum analysis function can be used to measure a DUT's spurious and harmonics, providing short sweep times along with high dynamic range and fine frequency resolution. It quickly detects undesired signal components (spurious) in converters and T/R modules. The marker-to-spectrumfunction directly gets to the root of problems in the event of unexpected S-parameter results, thus providing fast and extremely useful integrated diagnostics.
VNA Source Phase Control Options for characterization of devices requiring a defined phase such as differential amplifiers, mixers, IQ mixers and others.
R&S®ZNA-K8 / R&S®ZVA-K8 - software option for clear and straightforward converter control and converter parameter settings.
There are several reasons to characterize RF components under pulsed conditions. Often it is to prevent thermal damage to the device under test or to characterize it under operating conditions. Vector Network Analyzers offer integrated hardware and software for accurate device characterization under pulsed conditions. This hardware includes built-in pulse modulators, pulse generators and synchronization IO including for external device control.
Options for characterizing frequency-converting devices such as mixers, block upconverters and downconverters, T/R modules and others.
mmWave receiver module, consisting of a harmonic mixer, a booster amplifier for controlled input power and a low noise amplifier for the IF signal.
The TDR option displays discontinuities, reflection factors or impedance versus delay/length.
mmWave receiver modules for antenna test systems with highest dynamic range.
Noise figure measurement with vector network analyzers
A computer simulation for the R&S®ZNA, R&S®ZNB, R&S®ZNBT and R&S®ZND that can be used to test a remote control program without the need for any VNA hardware.
R&S®RF Ports Alignment Software - Tailored solution for calibrating amplitude, time and phase of multi-channel SMW200A setups.
Switch matrix - configurable switch matrix for up to 48 network analyzer ports, up to 26.5 GHz.
R&S®ZN-Z2xx: high-end manual calibration kits, male and female standards, up to 110 GHz, S-parameter based characterization.
Describes all instrument functions and remote control commands, as well as measurement and programming examples.
The R&S®ZN‑ZCG comb generator enables precise phase calibration of the R&S®ZNA VNA, supporting phase and delay measurements with LO access.
Verification kits are used to perform uncertainty evaluations of vector network analyzers. Option R&S®ZNA-K50(P) provides additional uncertainty analysis.
Calibration accessories for frequency converting measurements, Wide band application
The R&S®ZCxxx millimeterwave converters allow millimeterwave measurements in the frequency range up to 1.1 THz.
R&S®ZVA-Zxxx millimeterwave converters have a wide dynamic range. Rohde & Schwarz converters are very convenient to operate and enable fast measurements.
Get the most out of your high-frequency band test and measurement tasks with versatile mmWave converters from Rohde & Schwarz.
Rohde & Schwarz offers a wide range of versatile vector network analyzers and accessories with excellent characteristics.
25-Aug-2025 | Press Releases | Test & measurement
Rohde & Schwarz collaborates successfully with the Taiwan Space Agency to develop a dual-function satellite test solutionRohde & Schwarz has developed the first integrated testing solution for the Taiwan Space Agency (TASA), enabling seamless EMC and antenna measurements within a single chamber.
Ensures compliance of high speed Ethernet cable assemblies with fast automation and easy testing.
05-Oct-2025
07-Apr-2021 | Press Releases | Test & measurement
Rohde & Schwarz introduces new R&S ZNA vector network analyzers with up to 67 GHz frequency rangeThe R&S ZNA high-end vector network analyzer (VNA) now features models with 50 GHz and 67 GHz maximum frequencies. This opens up the VNA’s outstanding RF performance, unique hardware concept and innovative touch operation to new areas of application. Signal integrity measurements as well as A&D and 5G component and module characterization are main applications for the new analyzer models.
Provides information on security issues when working with R&S®ZNA in secure areas.
10-Oct-2024 | Press Releases | Automotive
Patented antenna digital twin solution from Rohde & Schwarz and IMST optimizes automotive connectivityRohde & Schwarz, in collaboration with wireless communications engineering experts IMST GmbH, has developed a patented antenna digital twin solution, effectively addressing a multitude of challenges and delivering considerable benefits for vehicle manufacturers and their suppliers to optimize automotive connectivity. The solution combines measurements of the antenna characteristics with simulation of the electromagnetic wave propagation to optimize the antennas’ design and their position to ensure for example optimal WiFi coverage inside the vehicle.
13-Oct-2020 | Press Releases | Test & measurement
Rohde & Schwarz announces awards success with touch-operated analyzerThe R&S ZNA vector network analyzer is named the Test, Measurement & Inspection product of the year at the Electronics Industry Awards.
Provides the information required to prepare the instrument for use and start working.
19-Jul-2022 | Press Releases | Test & measurement
Rohde & Schwarz announces on-wafer device characterization test solutionRohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.