R&S®ZNA Vector Network Analyzers - Media center

26-Mar-2024 | Press Releases | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

Powerful solutions for testing high-speed digital interfaces: verification ✓ debugging ✓ and compliance testing ► Get more information!

Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.

Calibration of two channels simultaneously with remote commands

I have an existing limit line. Is it possible to apply a vertical offset?

Is there a way to query the data of all traces at once?

Is it possible to automatically restart a ZNB with return of the AC power?

Export complex data of a trace with mathematics and time gating.

VNA - do I really need a sliding match for calibration?

13-Jan-2022 | Press Releases | Test & measurement

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.

Active cal kit or cal unit does not contain all standards needed for selected cal procedure.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

Provides the information required to prepare the instrument for use and start working.

I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?

I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?

I have a file on my device. How can I get it in a simple way to my PC?

Explore material characterization techniques and applications. Discover impedance analyzers and other material characterization equipment from an industry leader.

How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.

Rohde & Schwarz simplifies the challenging and extensive task of characterizing active components such as RF power amplifiers and RF frontends.

03-Sep-2024 | Press Releases | Test & measurement

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

For the demanding measurements, the high-end R&S®ZNA vector network analyzer, R&S®ATS800B and R&S®ATS800R compact antenna test ranges (CATR) are used.

21-Mar-2022 | Press Releases | Test & measurement

At DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.

Choose Rohde & Schwarz signal and power integrity test solutions for the best application fit thanks to time and frequency considerations.

Choose Rohde & Schwarz test solutions for power amplifier efficiency optimization for their dual path signal generation capabilities and ease of results analysis.

Early wafer-level qualification of RF components ensures quality and saves money

14-Jul-2022

On-wafer characterization at sub-THz frequencies

12-Dec-2023

Maximizing power amplifier efficiency with harmonic load pull measurements

17-Apr-2023

Essential cost consideration