Models: R&S®ZNA26, R&S®ZNA26, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA50, R&S®ZNA50, R&S®ZNA67, R&S®ZNA67, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT

Models: R&S®ZNA26, R&S®ZNA26, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA50, R&S®ZNA50, R&S®ZNA67, R&S®ZNA67, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT

19-Jul-2022 | Press Releases | Test & measurement

Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.

This document is an addendum to the "Options" section of the R&S®ZNA specifications (PD 5215.4652.22). It provides the technical specifications of the the following R&S®ZNA options: R&S®ZNA26-B10, R&S®ZNA43-B10, R&S®ZNA50-B10, R&S®ZNA67-B10.

With high precision, an intuitive user interface and uncertainty bands provided directly on the screen, the R&S®ZNA takes accuracy to a new level.

19-Jul-2021

The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

19-Jul-2021

The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

27-Apr-2023

Receiver and LNB characterization

12-Jun-2025

30-May-2023 | Press Releases | Wireless communications

The Institute of Electronics, Microelectronics and Nanotechnology (IEMN, Lille, France) and Rohde & Schwarz have expanded their collaboration to research THz communications that utilize photonic technologies. In a recent demonstration, IEMN reached a milestone when researchers achieved generated a 300 GHz bidirectional link over an outdoor distance of 645 m for use in future 6G backhauling scenarios. The R&S SMA100B microwave signal generator from Rohde & Schwarz was a crucial component in the performance test setup. The R&S SMA100B provides an ultra-low phase noise signal that helps accelerate THz communications research and development to ready it for industrialization.

The R&S®ZNA vector network analyzer offers a dynamic range and unlocks potential applications that previously could not be addressed with a vector network analyzer.

07-Jan-2019

Addendum to options

The R&S®ZNA vector network analyzer enables high-power amplifier testing under real operating conditions.

14-Jul-2025

Technical specifications of the R&S®ZNA vector network analyzer. Offering outstanding RF characteristics, a unique and comprehensive hardware architecture and a DUT oriented operation concept, the R&S®ZNA high-end vector network analyzer makes demanding measurements easier than ever before.

Differential RF on-wafer measurements up to 110 GHz on MPI probe stations

14-Aug-2025

This document provides the technical specifications of the R&S®ZNA67EXT vector network analyzer system.

Offering outstanding RF characteristics, a unique and comprehensive hardware architecture and a DUT oriented operation concept, the R&S®ZNA high-end vector network analyzer makes demanding measurements easier than ever before.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

ZNA - EU Declaration of Conformity

ZNA67EXT - EU Declaration of Conformity

Provides the information required to prepare the instrument for use and start working.

Transmit/receive module and AESA radar testing

12-Jun-2025

Vector Network Analyzers of t ZNA and ZNB family are able to measure magnitude and phase of complex S-parameters of a device under test (DUT) in the frequency domain.

30-Jul-2020 | AN-No. 1EP83

Three-port on-wafer mixer measurements up to the THz range on MPI probe stations

14-Aug-2025

This application note describes a method using the R&S®ZNA analyzer family to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.

11-Jul-2019 | AN-No. 1EZ81

RF system noise contributions define receiver capabilities and sensitivity. The noise figure measures how the critical components affect the signal.

28-Jan-2022

mmWave measurements: The R&S®ZVA-Zxxx and R&S®ZCxxx mmWave converters extend the R&S®ZNA vector network analyzer frequency range up to 1.1 THz.

27-Feb-2025

Load pull is a powerful method to characterize RF power amplifiers and enablse model extraction and validation and performance, ruggedness and efficiency testing.

02-Sep-2020

13-Jan-2022 | Press Releases | Test & measurement

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.

Noise figure is an important parameter that describes the noise contribution of an electronic device. A classical approach to measure the noise figure is to use a noise source which delivers two different input noise powers by switching between a “hot” and a “cold” state and a noise receiver

23-Dec-2021 | AN-No. 1SL378