October, 2025
Date
Location
Spain and Portugal
Additional info
Educational days with seminar and demonstrations in the exhibition area. Free admission with previous registration.
On Wafer Load Pull Measurements Seminar
In collaboration with: Rohde & Schwarz, Maury Microwave and MPI
Discover the first edition of the On Wafer Load Pull Measurements Seminar, designed to provide a comprehensive overview of advanced measurement techniques essential for modern semiconductor development.
Join the experts from Rohde & Schwarz and our partners Maury and MPI and discover a demonstration of advanced on wafer load pull characterization of RF amplifiers, leveraging the precision of our R&S Vector Network Analyzer integrated with MPI’s probe station and Maury’s impedance tuners: a capability setting a new standard in semiconductor measurement.
Presentations will be delivered in English and Spanish in Valencia, and in English in Porto.
Register for the stop of your interest!