Models: R&S®ZNA26, R&S®ZNA26, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA50, R&S®ZNA50, R&S®ZNA67, R&S®ZNA67, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT

Ensures compliance of high speed Ethernet cable assemblies with fast automation and easy testing.

05-Oct-2025

This document is an addendum to the "Options" section of the R&S®ZNA specifications (PD 5215.4652.22). It provides the technical specifications of the the following R&S®ZNA options: R&S®ZNA26-B10, R&S®ZNA43-B10, R&S®ZNA50-B10, R&S®ZNA67-B10.

With high precision, an intuitive user interface and uncertainty bands provided directly on the screen, the R&S®ZNA takes accuracy to a new level.

19-Jul-2021

The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

19-Jul-2021

The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

27-Apr-2023

Receiver and LNB characterization

12-Jun-2025

The R&S®ZNA vector network analyzer offers a dynamic range and unlocks potential applications that previously could not be addressed with a vector network analyzer.

07-Jan-2019

19-Jul-2022 | Press Releases | Test & measurement

Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.

The R&S®ZNA vector network analyzer enables high-power amplifier testing under real operating conditions.

14-Jul-2025

Addendum to options

30-May-2023 | Press Releases | Wireless communications

The Institute of Electronics, Microelectronics and Nanotechnology (IEMN, Lille, France) and Rohde & Schwarz have expanded their collaboration to research THz communications that utilize photonic technologies. In a recent demonstration, IEMN reached a milestone when researchers achieved generated a 300 GHz bidirectional link over an outdoor distance of 645 m for use in future 6G backhauling scenarios. The R&S SMA100B microwave signal generator from Rohde & Schwarz was a crucial component in the performance test setup. The R&S SMA100B provides an ultra-low phase noise signal that helps accelerate THz communications research and development to ready it for industrialization.

Technical specifications of the R&S®ZNA vector network analyzer. Offering outstanding RF characteristics, a unique and comprehensive hardware architecture and a DUT oriented operation concept, the R&S®ZNA high-end vector network analyzer makes demanding measurements easier than ever before.

Differential RF on-wafer measurements up to 110 GHz on MPI probe stations

14-Aug-2025

This document provides the technical specifications of the R&S®ZNA67EXT vector network analyzer system.

Offering outstanding RF characteristics, a unique and comprehensive hardware architecture and a DUT oriented operation concept, the R&S®ZNA high-end vector network analyzer makes demanding measurements easier than ever before.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

ZNA - EU Declaration of Conformity

ZNA67EXT - EU Declaration of Conformity

Provides the information required to prepare the instrument for use and start working.

Transmit/receive module and AESA radar testing

12-Jun-2025

Vector Network Analyzers of t ZNA and ZNB family are able to measure magnitude and phase of complex S-parameters of a device under test (DUT) in the frequency domain.

30-Jul-2020 | AN-No. 1EP83

Three-port on-wafer mixer measurements up to the THz range on MPI probe stations

14-Aug-2025

This application note describes a method using the R&S®ZNA analyzer family to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.

11-Jul-2019 | AN-No. 1EZ81

mmWave measurements: The R&S®ZVA-Zxxx and R&S®ZCxxx mmWave converters extend the R&S®ZNA vector network analyzer frequency range up to 1.1 THz.

27-Feb-2025

RF system noise contributions define receiver capabilities and sensitivity. The noise figure measures how the critical components affect the signal.

28-Jan-2022

Load pull is a powerful method to characterize RF power amplifiers and enablse model extraction and validation and performance, ruggedness and efficiency testing.

02-Sep-2020

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.

13-Jan-2022 | Press Releases | Test & measurement

The University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.

Noise figure is an important parameter that describes the noise contribution of an electronic device. A classical approach to measure the noise figure is to use a noise source which delivers two different input noise powers by switching between a “hot” and a “cold” state and a noise receiver

23-Dec-2021 | AN-No. 1SL378