Joint Technical Event from IEEE EMC Society German Chapter and Rohde & Schwarz

Joint Technical Event from IEEE EMC Society German Chapter and Rohde & Schwarz

Date
Date

June 25, 2025
13:00 to 18:00 CEST

Register now
Country
Country

R&S headquarter Munich, Germany or online

Info
Info

Joint technical event featuring EMC talks

Join us for a technical event featuring EMC talks by Dr. Benoit Derat and Mr. Francesco Pio Cecca and an EMI troubleshooting workshop by Mr. Lee Hill.

On-site delegates can network with industry colleagues during the social event and tour the EMC test facility at Rohde & Schwarz.

Date: June 25, 2025
Time: 13:00 to 18:00 CEST

Please register for this event and choose your form of participation. Seats on site are limited.

We are looking forward to meeting you in Munich.

Agenda

Time Topic
(45 min talk including Q&A)
Presenter
13:00 – 13:30 Visitor Registration All
13:30 – 14:30 EMC chamber tour + Break Rohde & Schwarz
14:30 – 14:45 Opening Keynote Dr. Sebastian Koj
14:45 – 15:30 The Antenna Digital Twin – When Measurements and Simulations Unite Dr. Benoit Derat
15:30 – 16:15 Time Domain Plane Wave Model for Single Carrier Pulse Response in Reverberation Chambers Mr. Francesco Pio Cecca
16:15 – 16:30 Short break All
16:30 – 17:15 EMC Troubleshooting Case History: Would You Like Some EMI With Your Coffee? Mr. Lee Hill
17:15 – 18:00 Networking (snacks & drinks) All

Our presenters

  • 1Dr. Benoit Derat
  • 2Mr. Francesco Pio Cecca
  • 3Mr. Lee Hill
Dr. Benoit Derat

Dr. Benoit Derat

IEEE EMC Society Distinguished Lecturer, Term 2024-2025
Senior Director for Systems Developments and Project Implementations, Rohde & Schwarz

EMC-S Distinguished Lecture: How Close Can Far-Field Be? Getting the Best Out of Your Measurement Range

Trends in modern wireless communications, including the use of massive MIMO and millimeter wave frequencies, have supported an increased deployment of electrically large antennas. This created technical and economic challenges as many EMC, or regulatory tests require a far-field condition. This talk provides an overview of the recent findings in defining the shortest possible far-field test distance, depending on the size of the device under test, its operation frequency, the target metric, and the upper bound acceptable measurement deviation. Practical ways are also described to determine the maximum antenna aperture size that can be tested in the far-field at a given frequency and for a maximum error, in an existing chamber with a defined range length.

How to find us

How to find us

Please download the directions to Rohde & Schwarz corporate headquaters in Munich.

Event partners:

EMC SOCIETY, IEEE
nepit
Universität Magdeburg
SILENT