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R&S®FSx-K50 Spurious Measurement Application - Specifications
This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.
Perform High impedance measurements with spectrum analyzers
Active, high-impedance probes can be connected to spectrum analyzers, providing a practical and highly precise measurement solution to overcome an otherwise cumbersome RF testing issue. This application note provides information on how to use oscilloscope probes in RF measurements using spectrum analyzers
04-Jul-2023 | AN-No. 1EF116
Applications
R&S®Fxx-K30 Noise Figure Measurement Application – R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30 - Specifications
This document provides the technical specifications of the R&S®Fxx-K30 noise figure measurement application.
R&S®NRP-Zxx Power Sensors - Specifications
This document provides the technical specifications of the R&S®NRP-Zxx power sensors
Scenario generation and receiver testing
Overview of Rohde & Schwarz scenario generation and receiver testing with explanation of application fields.
Solutions
R&S®VSE-K7/Fxx-K7/RTO AM/FM/PM Modulation Analysis - Specifications
R&S VSE-K7/Fxx-K7/RTO AM/FM/PM Modulation Analysis - Specifications
R&S®VSE-K70x/FSx-K70x/FPx-K70x Vector Signal Analysis Application - Specifications
R&S VSE-K70x/FSx-K70x/FPx-K70x Vector Signal Analysis Application - Specifications