background

Dynamic Characterization of Next-Generation Power Devices: Automation and Beyond

CS Wong - Oscilloscope Product Manager, Rohde & Schwarz

Tristan Evans, PhD - R&D Engineer, PE-Systems GmbH

This session by PE-Systems and Rohde & Schwarz provides a comprehensive overview of the Double Pulse Test (DPT), highlighting its significance, key challenges, and innovative solutions for effective implementation. It will address issues such as parasitic inductance and measurement stability while demonstrating automated approaches that enhance testing efficiency, accuracy, and repeatability to advance next-generation power electronics development.

Demander des informations

Vous avez des questions ou besoin d'informations supplémentaires ? Remplissez simplement ce formulaire et nous vous recontacterons rapidement.

Marketing de permission

Votre demande a bien été envoyée ! Nous vous contacterons dans les plus brefs délais.
An error is occurred, please try it again later.