Advanced eye analysis software for verification and debugging of signal integrity with an eye diagram and tools such as mask test, histogram, automated eye measurements, etc.

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K135 enables PAM-N Analysis for teh RTO and RTP Oscilloscopes.

Mar 26, 2024 | Press Release | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

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Learn about DisplayPort transmitter testing with Rohde & Schwarz.

In this webinar you will learn more about a novel way of capturing and measuring eye diagrams in hardware.

This webinar is intended for engineers working on high-speed digital interface designs and testing.

This example demonstrates the power of Advanced Eye analysis with the RTP oscilloscope on an Automotive Ethernet PAM4 signal at 5 Gbaud. PAM-N Analysis with the R&S RTP Oscilloscope (Part 3) Learn about key advantages of the PAM-N analysis option on the R&S RTP & RTO6 oscilloscopes together with the Advanced Eye option to characterize and verify signal transitions.

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The Advanced Eye Analysis option enables on the R&S RTP oscilloscope utilizes a hardware-based Clock-Data-Recovery trigger (CDR). In combination with the PAM-N Analysis option this true CDR trigger operates also on PAM signals and enables a Live Eye diagram for continous monitor of the signal quality over hours or even days.

Mar 01, 2023 | Press Release | Test & measurement

Embedded systems are at the core of today’s electronic devices, whether in consumer electronics, telecommunications, industrial, medical, automotive or aerospace applications. Flawless operation is crucial, and engineers face complex challenges when designing ever more compact embedded systems which meet today’s demands of efficiency, safety, reliability and interoperability. Rohde & Schwarz addresses these challenges with its wide-ranging test and measurement solutions showcased at the embedded world Exhibition & Conference 2023 in Nuremberg.