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Describes all instrument functions and remote control commands.

Oct 01, 2024 | Comunicado de prensa

Rohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.

May 27, 2024 | Comunicado de prensa

Rohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.

Jun 11, 2024 | Comunicado de prensa

Rohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.

Oct 28, 2024 | Comunicado de prensa

Test and measurement technology leader Rohde & Schwarz with decades of expertise is set to showcase at electronica 2024, held in its home city Munich. Visitors will be able to experience the company’s wide range of solutions designed to help them tackle their test and measurement challenges in the development, verification and production of electronic components and devices – from the everyday to the extraordinary.

Jul 17, 2024 | Comunicado de prensa

Rohde & Schwarz introduces the industry’s first ASIC-based zone triggering for the MXO oscilloscope series. It can offer the world’s fastest zone trigger update rate of up to 600.000 waveforms per second and less than 1.45 us blind time between trigger events.

Jan 23, 2025 | Comunicado de prensa

Rohde & Schwarz launches R&S ScopeStudio, an innovative application that brings the functionality of the MXO series oscilloscopes to a PC. It allows engineers to visualize, analyze, document and share oscilloscope measurements, making development teams more efficient.

Feb 13, 2025 | Comunicado de prensa

Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the embedded world, to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.

Models: R&S®MXO54-350, R&S®MXO54-500, R&S®MXO54-1000, R&S®MXO54-2000, R&S®MXO58-100, R&S®MXO58-200, R&S®MXO58-350, R&S®MXO58-500, R&S®MXO58-1000, R&S®MXO58-2000

Models: R&S®MXO54-350, R&S®MXO54-500, R&S®MXO54-1000, R&S®MXO54-2000, R&S®MXO58-100, R&S®MXO58-200, R&S®MXO58-350, R&S®MXO58-500, R&S®MXO58-1000, R&S®MXO58-2000

La opción de análisis de respuesta en frecuencia R&S®RTx-K36 representa una alternativa económica a los analizadores de redes de baja frecuencia o los analizadores de frecuencia independientes y específicos.

dic 18, 2018

Apr 29, 2025 | Comunicado de prensa

Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.

Mar 26, 2024 | Comunicado de prensa

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

This document provides the technical specifications of the MXO 5C series oscilloscope.

Superior time and frequency measurements. Compact for rackmount and bench applications.

The MXO 5C (C for compact) delivers breakthrough MXO 5 series oscilloscope technology in a 2 HU form factor.

Secuenciación de potencia y análisis de ruido de rizado sencillos con osciloscopios MXO

abr 22, 2024

MXO5C- EU Declaration of Conformity

R&S®MXO 5C Oscilloscope/Digitizer Next generation oscilloscope in a 2U-high form factor - Fact Sheet Folletos y fichas técnicas

Medidas de tiempo y frecuencia al más alto nivel. Formato compacto para montaje en rack y aplicaciones de sobremesa.

Dec 19, 2024 | Comunicado de prensa

Rohde & Schwarz, a global leader in test and measurement solutions, is excited to unveil its latest innovations and demonstrations at CES 2025. Renowned for its pivotal role in the automotive ecosystem, Rohde & Schwarz consistently makes significant contributions to advancing the industry’s vision of autonomous driving, electrification, and connectivity.

Aug 25, 2025 | Comunicado de prensa

At EMC Europe 2025 Rohde & Schwarz will present a complete portfolio of solutions for EMC and field strength testing.

Models: R&S®MXO5C-43, R&S®MXO5C-45, R&S®MXO5C-410, R&S®MXO5C-420, R&S®MXO5C-81, R&S®MXO5C-82, R&S®MXO5C-83, R&S®MXO5C-85, R&S®MXO5C-810, R&S®MXO5C-820

Models: R&S®MXO5C-43, R&S®MXO5C-45, R&S®MXO5C-410, R&S®MXO5C-420, R&S®MXO5C-81, R&S®MXO5C-82, R&S®MXO5C-83, R&S®MXO5C-85, R&S®MXO5C-810, R&S®MXO5C-820

This document provides: - An explanation of analog versus digital triggering architectures - User advantages for oscilloscopes that have digital triggering - How to determine if an oscilloscope has a digital or analog trigger

This document provides: - An explanation of update rate - How users can quickly perform their own update rate characterization - How to compare vendor update rates - Benefits of fast update rate

Acortar el tiempo en ATE con «trigger-out»

may 30, 2024

Selecting Your Next Oscilloscope:

If you are selecting your next oscilloscope and want more insight on how to understand ENOB values measured and published by oscilloscope manufacturers, this document is for you. The effective number of bits (ENOB) is a way of quantifying the quality of analog to digital conversion. A higher ENOB means that voltage levels recorded in analog to digital conversion are more accurate. Understanding oscilloscope vendor-supplied ENOB values can be complex. This document focuses on interpretation of measured ENOB results made on oscilloscopes rather than the math behind ENOB calculations.

Jun 21, 2024 | N.º de nota de aplicación 1TD12

The R&S®RT-ZM modular probe system addresses current probing requirements with a technologically sophisticated yet easy-to-use solution.

This document provides: - A description of how oscilloscope acquisition memory is defined - Insight into the relationship between memory and other oscilloscope parameters - Examples where deep memory provides value