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The R&S®RT-ZISO isolated probing system sets new standards in optical probe technology. The innovative solution delivers unparalleled accuracy, sensitivity, dynamic range and bandwidth while enabling next-generation wide bandgap (WBG) SiC and GaN power designs. The remarkable R&S®RT-ZISO can make precise differential measurements up to ±3000 V on common mode voltage of ±60 kV with rise times up to < 450 ps. The solution can suppress fast common mode edges that would otherwise distort and disturb accurate measurements.

Das R&S®RT-ZISO isolierte Tastkopfsystem setzt neue Maßstäbe für die Technologie optischer Tastköpfe. Diese innovative Lösung zeichnet sich durch bisher unerreichte Genauigkeit, Empfindlichkeit, Dynamik und Bandbreite aus und ermöglicht das Vermessen neuartiger Leistungselektronik auf Basis von SiC- und GaN-Halbleitern mit großer Bandlücke (Wide Bandgap, WBG). Die herausragende Leistung des R&S®RT-ZISO Systems ermöglicht präzise differenzielle Messungen bis ±3000 V an Gleichtaktspannungen von ±60 kV bei Anstiegszeiten bis < 450 ps.

Высокое напряжение. Оптическая развязка. Удобный интерфейс.

高壓。光隔離。無縫介面。

R&S®RT-ZISO 絶縁プロービング・システムは、絶縁プローブテクノロジーの新しい基準を打ち立てます。この革新的なソリューションは、比類ない確度、感度、ダイナミックレンジ、帯域幅を実現しており、次世代のワイドバンドギャップ（WBG）半導体であるSiCやGaNベースの電源設計を可能にします。ソリューションの中核として優れた性能を提供しており、立ち上がり時間が450 ps未満、基準電圧レベルが±60 kVの電圧について最大±3,000 Vまで正確な差動測定を実行できます。加えて、このソリューションにより、正確な測定を阻害する高速なコモンモード信号を抑制できます。

고전압 솔루션, 광학 절연, 유연한 인터페이스

高压 光隔离 无缝接口

R&S®RT-ZISO Isolated Probing System - Fact Sheet Brochures and Data Sheets

R&S®RT-ZISO Isolated Probing System versus Tektronix IsoVu TIVP - Comparison Sheet Brochures and Data Sheets

Alta tensión. Aislamiento óptico. Conexión directa.

Haute tension. Isolement optique. Interface fluide.

11-Jun-2024 | Press Releases

Rohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.

29-Apr-2025 | Press Releases

Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.

The Rohde & Schwarz user manual describes the optical isolated probe system R&S®RT-ZISO.

19-Dec-2024 | Press Releases

Rohde & Schwarz, a global leader in test and measurement solutions, is excited to unveil its latest innovations and demonstrations at CES 2025. Renowned for its pivotal role in the automotive ecosystem, Rohde & Schwarz consistently makes significant contributions to advancing the industry’s vision of autonomous driving, electrification, and connectivity.

Isolated probing system Accurately measure fast switching signals in noisy environments with RT-ZISO, ideal for WBG testing. Accurately measure fast switching signals in noisy environments with RT-ZISO, ideal for WBG testing. Measuring accurately in wide bandgap application

Isolated probing system Learn about RT-ZISO safety features and effortless setup to transform your testing workflow. Learn about RT-ZISO safety features and effortless setup to transform your testing workflow. Oscilloscope, probe Safe to measure and easy to operate

06-Mar-2025 | Press Releases

Rohde & Schwarz is set to present a comprehensive suite of EMC and field strength test equipment at the EMV show 2025 in Stuttgart from March 25 to 27, 2025. The display will include standalone instruments, software, and systems designed to meet various industry standards. The solutions support commercial, automotive, military and aerospace standards, as well as ETSI and FCC standards. Visitors can witness these innovative demonstrations at booth number 615.

13-Feb-2025 | Press Releases

Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the embedded world, to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.

28-Oct-2024 | Press Releases

Test and measurement technology leader Rohde & Schwarz with decades of expertise is set to showcase at electronica 2024, held in its home city Munich. Visitors will be able to experience the company’s wide range of solutions designed to help them tackle their test and measurement challenges in the development, verification and production of electronic components and devices – from the everyday to the extraordinary.

Common mode distortion of wide-bandgap power electronics probing

25-Nov-2024

This document provides the technical specifications of the R&S®RT-Zxx high voltage and current probes

RTZISO probe - isolated probing system for oscilloscopes RT ZISO probe - isolated probing system for oscilloscopes

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