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The R&S®FSWP phase noise analyzer and VCO tester is a high-end instrument that accurately analyzes noise in key radar and communications system components.

16-May-2025

This paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings and discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements.

31-Mar-2020

Models: R&S®FSWP8, R&S®FSWP26, R&S®FSWP50

Models: R&S®FSWP8, R&S®FSWP26, R&S®FSWP50

Models: R&S®FSWP8, R&S®FSWP26, R&S®FSWP50

This paper will discuss several measurement settings which affect measurement speed and provide suggestions on improving this overall speed.

08-Oct-2020 | AN-No. GFM354

This application note reviews the measurement uncertainty analysis and traceability for phase noise with the new R&S®FSWP Phase Noise Analyzer.

05-Jul-2016 | AN-No. 1EF95

The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low noise internal sources and cross-correlation. It can measure phase noise on highly stable sources such as those found in radar applications in just seconds. Additional options such as pulsed signal measurements, residual phase noise characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument. A multitouch display ensures straightforward and intuitive operation. The embedded SCPI recorder enables easy creation of executable scripts.

Technical specifications of the R&S®FSWP phase noise analyzer and VCO tester.

This document provides the technical specifications of the R&S®FSWP phase noise analyzer and VCO tester.

R&S®FSWP Dynamic noise figure measurements - Application Card

FSWP - EU Declaration of Conformity

R&S®FSWP (Facelift) Phase Noise Analyzer and VCO Tester | 相位噪声分析仪和VCO测试仪 - Product Brochure Brochures and Data Sheets Product brochure

The R&S FSWP phase noise analyzer is the perfect tool for verifying clock sources to ensure accuracy of design requirements and proper operation.

30-Sep-2021

This application note reviews the fundamentals of residual or additive noise and addresses measurement techniques for determining the amplitude (AM) and phase noise added by two-port devices such as: amplifiers, mixers, block frequency converters, multipliers, dividers, and frequency synthesizers.

09-Oct-2017 | AN-No. 1EF100

This application note will focus on phase noise measurements for pulsed RF carriers such as those used for radar systems.

18-May-2016 | AN-No. 1EF94

The alternative approach presented in this paper employs a low phase noise local oscillator for direct down-conversion of the DUT signal.

09-May-2016

This application note provides basic information about frequency and phase settling time measurements and how the measurement is implemented inside modern phase noise analyzers.

28-Jun-2018 | AN-No. 1EF102

R&S®FSWP-K7CAL Enhanced Specifications for AM/FM/φM Modulation Analysis - Specifications

R&S®FSWP Getting Started manual; provides the information needed to set up and start working with the instrument. Basic operations and handling are described. Safety information is also included.

It is recommended to use jitter measurement instruments for both the time and frequency domain in order to differentiate between fast and slow moving artifacts.

22-Aug-2017

This paper describes the measurement of additive/residual phase noise of power amplifiers or multipliers for example for automotive RADAR sensors at 80 GHz using the interferometric measurement approach in combination with a phase noise and VCO tester R&S FSWP. The setup provides a way to characterize the additive/residual phase noise of amplifiers down to -150 dBc/Hz at 100 kHz offset even in the microwave range at 80 GHz.

11-Sep-2024 | AN-No. 1EF117

Specifications dokument

21-Jun-2023 | Press Releases

Rohde & Schwarz and Zurich Instruments will present advanced test and measurement solutions for photonics at the LASER World of PHOTONICS tradeshow in Munich. Highlighted solutions include the R&S FSPN and R&S FSWP, two exceptionally powerful phase noise analyzers for characterizing laser systems. Visitors can also see demos of the R&S MXO 4 and R&S RTO6 oscilloscopes from Rohde & Schwarz as well as the Quantum Computing Control System (QCCS) and lock-in amplifiers from Zurich Instruments.

This document provides the technical specifications of the R&S®Fxx-K30 noise figure measurement application.

This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.

R&S®VSE-K60(x) / FSW-K60(x) / FSWP-K60(x) / FSV3-K60(x) Transient measurements - Specifications

Rohde & Schwarz user manual for the R&S®FSWP-K60 Transient Analysis measurement application; provides all the information specific to the application. All general instrument functions and settings common to all applications are described in the main R&S®FSWP user manual.

Rohde & Schwarz user manual for the R&S®FSWP-K5 Pulse Measurements application; provides all the information specific to the application. All general instrument functions and settings common to all applications are described in the main R&S®FSWP user manual.

Rohde & Schwarz user manual for the R&S®FSWP-K30 Noise Figure application; provides all the information specific to the application. All general instrument functions and settings common to all applications are described in the main R&S®FSWP user manual.