Библиотека новостей

May 22, 2025 | Пресс-релиз | Test & measurement

Zurich Instruments, a market leader in developing and marketing qubit control and readout electronics for quantum computers, and its parent company Rohde & Schwarz, have been selected as key partners in the National Quantum Computing Testbed Facility (NQCT) project in Queensland, Australia.

May 22, 2025 | Пресс-релиз | Aerospace

After four successful online events with over 1000 participants, Rohde & Schwarz is hosting its fifth Satellite Industry Day on June 3, 2025, on-site at its Munich campus. Rohde & Schwarz test and measurement experts and partners from the industry will present topics from 5G Non-Terresterial Network (NTN) and satellite testing to monitoring and regulatory issues. During breaks participants can experience cutting-edge test and measurement solutions.

May 21, 2025 | Пресс-релиз | Security

ipoque, a Rohde & Schwarz company and a trusted leader in deep packet inspection (DPI) and network analytics technology, and ElastiFlow, a leading provider of network flow data solutions, combine DPI-powered traffic intelligence with enriched flow data to deliver a turnkey network visibility solution for communication service providers and telcos.

May 20, 2025 | Пресс-релиз | Countering drones

Rohde & Schwarz introduces the next generation of ARDRONIS WiFi: A comprehensive solution for detecting, locating, and mitigating WiFi-controlled drones.

May 19, 2025 | Пресс-релиз | Multi-Domain

Rohde & Schwarz showcases its latest cutting-edge defense solutions at DSEI Japan 2025, mastering the entire signal chain, thereby enabling true spectrum dominance.

May 07, 2025 | Пресс-релиз | Broadcast and Media

Rohde & Schwarz will showcase its latest energy-efficient transmitters and 5G Broadcast technologies, designed to support network operators and content providers in driving operational resilience, sustainability, and new business models.

May 06, 2025 | Пресс-релиз | Test & measurement

Taking place over two days, Rohde & Schwarz and industry partners will be providing a virtual platform for RF design engineers to enhance their RF expertise and engage with industry leaders at the forefront of innovation. The online event will feature informative presentations by experts from Rohde & Schwarz, The University of Cardiff, Maury Microwave, Qorvo, MathWorks, Analog Devices and Greenerwave.

Apr 30, 2025 | Пресс-релиз | Automotive

Rohde & Schwarz, a member of the industry body IEEE and OPEN Alliance, is accelerating the development of the new automotive Ethernet variant 10BASE-T1S by offering compliance and trigger & decode options. Analog Devices, Inc. (ADI), a global semiconudctor leader that bridges the physical and digital worlds to enable breakthroughs at the Intelligent Edge, is one of the major providers of connectivity solutions in automotive. Rohde & Schwarz worked with ADI to use the R&S MXO 4 and 5 series oscilloscope with the R&S MXOx-K560 option to decode the 10BASE-T1S communication. The 10BASE-T1S Ethernet to Edge Bus, named E2B™, from ADI provides a low complexity, high flexibility edge node implementation for automotive applications. The oscilloscope, renowned for its fast update rate and deep memory, is proficient in capturing, triggering and decoding packets quickly as well as capturing both the big picture and smallest details of electrical signals with unparalleled accuracy. It is also able to detect intermittent faults in the communication bus with fast acquisitions.

Apr 30, 2025 | Пресс-релиз | Multi-Domain

Rohde & Schwarz demonstrates the next generation of SIGINT/EW systems,sensor fusion and signal analysis solutions, designed to meet the evolving needs of tactical and strategic missions.

Apr 29, 2025 | Пресс-релиз | Test & measurement

Rohde & Schwarz will showcase its latest solutions and advanced techniques for testing and analyzing power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. At the company’s booth (hall 7, booth 166), the spotlight will be on solutions utilizing the company’s cutting-edge test instruments to address the challenges of debugging next generation wide bandgap semiconductors like GaN and SiC.