아이 다이어그램 및 마스크 테스트, 히스토그램, 자동 아이 측정 등의 툴을 이용한 신호 무결성의 검증 및 디버깅을 위한 고급 아이 분석 소프트웨어

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K135 enables PAM-N Analysis for teh RTO and RTP Oscilloscopes.

A wide range of Signal Integrity solutions from Rohde & Schwarz ► Get more information!

Mar 26, 2024 | Press Release | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

Learn about DisplayPort transmitter testing with Rohde & Schwarz.

로데슈바르즈의 다양한 웹세미나에서 로데슈바르즈 오실로스코프와 솔루션에 대해 알아보십시오

In this webinar you will learn more about a novel way of capturing and measuring eye diagrams in hardware.

This webinar is intended for engineers working on high-speed digital interface designs and testing.

This example demonstrates the power of Advanced Eye analysis with the RTP oscilloscope on an Automotive Ethernet PAM4 signal at 5 Gbaud. PAM-N Analysis with the R&S RTP Oscilloscope (Part 3) Learn about key advantages of the PAM-N analysis option on the R&S RTP & RTO6 oscilloscopes together with the Advanced Eye option to characterize and verify signal transitions.

The Advanced Eye Analysis option enables on the R&S RTP oscilloscope utilizes a hardware-based Clock-Data-Recovery trigger (CDR). In combination with the PAM-N Analysis option this true CDR trigger operates also on PAM signals and enables a Live Eye diagram for continous monitor of the signal quality over hours or even days.

로데슈바르즈의 새로운 방식은 직접 설정 가능한 하드웨어 CDR을 사용하여 신호를 실제 "Live eye"로 보는 동시에 하드웨어 CDR로부터 비트 슬라이싱을 위한 타이밍 정보를 적용하여 비트 스트림 분석이 지속되도록 지원함으로써 가장 빠른 접근 방식을 제공해 높은 통계학적 신뢰도를 달성할 뿐만 아니라 더욱 깊이 있는 분석을 수행합니다.

Mar 01, 2023 | Press Release | Test & measurement

Embedded systems are at the core of today’s electronic devices, whether in consumer electronics, telecommunications, industrial, medical, automotive or aerospace applications. Flawless operation is crucial, and engineers face complex challenges when designing ever more compact embedded systems which meet today’s demands of efficiency, safety, reliability and interoperability. Rohde & Schwarz addresses these challenges with its wide-ranging test and measurement solutions showcased at the embedded world Exhibition & Conference 2023 in Nuremberg.