주요 사항
The R&S®FSWP phase noise analyzer and VCO tester is very sensitive thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
Save time and multiply measurement throughput
The internal R&S®FSWP sources enable measurement of highly sensitive oscillators such as DROs and OCXOs with a minimum number of cross correlations, saving considerable time. Adding hardware accelerated signal processing to the R&S®FSWP phase noise analyzer enables real-time phase noise measurements. Short measurement time is key since it speeds up the development to manufacturing process while increasing production throughput.
Phase noise measurement
Phase measurement of a high-end OCXO using cross-correlation.
Highest sensitivity for phase and amplitude noise measurement
The R&S®FSWP internal local oscillator surpasses phase-noise performance of almost any signal generator available on the market. Thanks to the internal low‑noise analyzer sources, just a few correlations are needed to measure a high-quality oscillator. This allows for the fastest possible measurement times.
Phase noise and sensitivity
The results can be displayed in separate windows or together in one window.
High-end phase noise analyzer and signal and spectrum analyzer in a single box
Users can examine the spectrum and demodulate the signal to measure EVM or pulse characteristics in different measurement channels. Designers of automatic test systems save space and money since they do not have to purchase an additional spectrum analyzer or vector signal analyzer. The R&S®FSWP is a future-proof investment. It is based on the high-end R&S®FSW with its unique RF performance and high sensitivity.
The R&S®FSWP does it all
Vector signal analysis, pulsed signal analysis, measurement of higher harmonics, sensitive phase noise measurements, etc.
Easy analysis of pulsed signal sources
Measuring the phase noise of pulsed sources used in radar applications has never been easier. The R&S®FSWP captures the signal and calculates all pulse parameters instantaneously. It offers cross‑correlation for phase noise tests and automatically determines the trigger/gating parameters required for pulsed source measurements. Gating enables the R&S®FSWP to achieve a larger dynamic range for pulsed phase noise measurements compared to other methods.
Pulsed signal analysis
Automated measurement of pulse parameters in the time domain and phase noise in the frequency domain.
Residual PN measurements on pulsed and CW signals
For high‑end radar applications, knowing the additional phase noise added by individual components (e.g. amplifiers) to the signal path is crucial, since these influence pulse-to-pulse phase stability. The components have to be tested using pulsed signals under real-world conditions. The R&S®FSWP has an internal signal source for measuring residual phase noise or pulse-to-pulse phase stability and it also provides additional inputs for other external sources.
Pulse-to-pulse phase stability
3D plot of pulse-to-pulse phase stability of several bursts.
Measure VCO parameters automatically
The R&S®FSWP features extremely low‑noise internal DC sources to supply and control voltage-controlled oscillators (VCO). The R&S®FSWP measures not only the fundamental voltage but also the power of the higher VCO harmonics relative to the tuning voltage. It also displays phase noise at various offset frequencies relative to the tuning voltage.
VCO results
Frequency, output power, tuning slope and current consumption vs. tuning voltage.
Frequency and phase measurements in the time domain
The R&S®FSWP offers up to 8 GHz bandwidth for analyzing frequency or phase characteristics versus time. The R&S®FSWP also offers narrowband analysis down to 40 MHz to examine the transient response of PLLs in detail.
Transient analysis
Persistence display of synthesizer frequency settlings.
Simultaneous measurement of amplitude noise and phase noise
The R&S®FSWP allows concurrent measurement of amplitude and phase noise up to a frequency offset of 30 MHz. It displays both results simultaneously in a single window or in separate windows.
Amplitude and phase noise
The grey area represents the improved sensitivity by cross-correlation, the yellow trace is the PN and the green one the AM noise.
Allan variance calculation from close-in phase noise
To characterize oscillator frequency stability, the R&S®FSWP calculates the Allan variance from the phase noise and displays it for up to 1 million seconds (minimum offset: 1 μHz). Unlike the time domain methods, this makes it easy to suppress undesired side effects that appear as spurious emissions in the phase noise spectrum. Even short-term disturbances due to the phase noise from internal sources can be easily suppressed with cross-correlation.
Allan variance and phase noise
Calculation of the Allan variance from 33 ns to 10 s based on the phase noise measurement for an offset range of 0.1 Hz to 30 MHz.
Software
Brings the experience and power of Rohde & Schwarz signal analysis to PC and cloud
Pulse measurements application
Analog modulation analysis (AM/FM/φM)
Modulation analysis for AM/FM/φM modulated single carriers
Transient measurements
Transient analysis
Transient chirp measurements
Transient analysis, requires R&S®VSE-K60
Transient hop measurements
Transient analysis, requires R&S®VSE-K60
Vector signal analysis
IEEE 802.11a/b/g measurements
WLAN signal analysis
IEEE 802.11p measurements
WLAN signal analysis
IEEE 802.11n measurements
WLAN signal analysis
IEEE 802.11ac measurements
WLAN signal analysis
IEEE 802.11ax measurements
WLAN signal analysis
OFDM signal analysis
User-defined Frequency Correction by SnP File
Licence Dongle
Floating license dongle
Software maintenance
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