126 Results
26-Mar-2024 | Press Releases
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
Calibration of two channels simultaneously with remote commands
I have an existing limit line. Is it possible to apply a vertical offset?
Is there a way to query the data of all traces at once?
Is it possible to automatically restart a ZNB with return of the AC power?
Export complex data of a trace with mathematics and time gating.
VNA - do I really need a sliding match for calibration?
13-Jan-2022 | Press Releases
Rohde & Schwarz and FormFactor support the University of Texas at Austin in research on improved RF switches for 5G and 6GThe University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.
Active cal kit or cal unit does not contain all standards needed for selected cal procedure.
Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation
Provides the information required to prepare the instrument for use and start working.
I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?
I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?
I have a file on my device. How can I get it in a simple way to my PC?
How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?
Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.
03-Sep-2024 | Press Releases
Rohde & Schwarz presents its top-notch RF and microwave test solutions at the EuMW 2024 in ParisT&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.
21-Mar-2022 | Press Releases
Rohde & Schwarz at DesignCon 2022 presents latest innovations for high-speed digital applicationsAt DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.
Early wafer-level qualification of RF components ensures quality and saves money
14-Jul-2022
On-wafer characterization at sub-THz frequencies
12-Dec-2023
Maximizing power amplifier efficiency with harmonic load pull measurements
17-Apr-2023
Instrument health guide for vector network analyzers | Pour les analyseurs de réseaux vectoriels - Flyer Brochures and Data Sheets Flyer
23-May-2023 | Press Releases
Rohde & Schwarz to host RF Design Challenge at IMS2023At IMS2023, Rohde & Schwarz is set to exhibit a range of live demos that showcase the cutting-edge developments within the industry. IMS attendees will also have the opportunity to participate in the interactive "Are you a genius?" RF Design challenge, putting their knowledge to the test at the Rohde & Schwarz booth.
ZNA, Average Pulse Measurements Making pulsed measurements with a vector network analyzer
ZNA, Point-In-Pulse Measurements Making pulsed measurements with a vector network analyzer
ZNA, vector network analyzer Making pulsed measurements with a vector network analyzer
The R&S®ZN-Z86 and R&S®ZN-Z86X switch matrices are designed and optimized for use with the R&S®ZNA, R&S®ZNB and R&S®ZNBT vector network analyzers. They offer a comprehensive, cost-effective total solution for simple to complex measurement tasks on multiport or multiple devices.
A Fabry-Pérot open resonator (FPOR) provided by QWED allows dielectric sheets to be accurately characterized in the frequency range from 110 GHz to 170 GHz using just one fixture.
14-Jan-2025
This paper investigates the evaluation complexities and importantce of PAM-4 interconnects at high data rates.
22-Oct-2020 | AN-No. GFM355