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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
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R&S®MXO 5 SERIES OSCILLOSCOPE Customize your R&S MXO5 Series layout for short learning curves and high productivity.
R&S®MXO 5 SERIES OSCILLOSCOPE Take advantage of the 12 bit ADC architecture from your MXO5 oscilloscope to see more signal details.
Models: R&S®MXO5C-43, R&S®MXO5C-45, R&S®MXO5C-410, R&S®MXO5C-420, R&S®MXO5C-81, R&S®MXO5C-82, R&S®MXO5C-83, R&S®MXO5C-85, R&S®MXO5C-810, R&S®MXO5C-820
This document provides the technical specifications of the MXO 5C series oscilloscope.
Superior time and frequency measurements. Compact for rackmount and bench applications.
R&S®MXO 5 Next generation oscilloscope: evolved for more challenges - Fact Sheet Brochures and Data Sheets
MXO5 Series versus Yokogawa DLM5000(HD) - Comparison Sheet Brochures and Data Sheets
R&S®MXO 5 Series Oscilloscope vs LeCroy WaveRunner 8000HD - Comp Sheet Brochures and Data Sheets
Models: R&S®MXO54-350, R&S®MXO54-500, R&S®MXO54-1000, R&S®MXO54-2000, R&S®MXO58-100, R&S®MXO58-200, R&S®MXO58-350, R&S®MXO58-500, R&S®MXO58-1000, R&S®MXO58-2000
R&S®MXO 5 Series versus Tektronix 5 Series B MSO - Comp Sheet Brochures and Data Sheets
Selecting your next oscilloscope: Why fast update rate matters - White Paper Brochures and Data Sheets White Paper
Selecting your next oscilloscope: Why digital triggering matters - White Paper Brochures and Data Sheets White Paper
Selecting your next oscilloscope: Why deep memory matters - White Paper Brochures and Data Sheets White Paper
20-Jan-2025 | Press Releases
Rohde & Schwarz to host the 2025 Digital Debug Design Challenge at DesignConRohde & Schwarz, a leading provider of high-performance test and measurement solutions, has announced their plans for the upcoming DesignCon 2025 tradeshow.
Analyzing power designs for high-speed SoCs with multiphase buck converters
13-Jan-2025
19-Jan-2024 | Press Releases
DesignCon 2024: Rohde & Schwarz Invites Participants for its Digital Debug Design ChallengeDesignCon 2024 will witness Rohde & Schwarz demonstrate live cutting-edge industry innovations.
31-Oct-2023 | Press Releases | Test & measurement
Evolved for more challenges: Rohde & Schwarz adds eight-channel R&S MXO 5 to next-generation oscilloscopesRohde & Schwarz presents the new R&S MXO 5 oscilloscopes, its first with eight channels. It takes measurement performance to the next level.
15-May-2024 | Press Releases | Test & measurement
Rohde & Schwarz introduces the MXO 5C series, the world’s most compact oscilloscope with up to 2 GHz bandwidthThe new MXO 5C is the first oscilloscope without an integrated display from Rohde & Schwarz.
01-Oct-2024 | Press Releases | Test & measurement
Rohde & Schwarz showcases its cutting-edge test solutions for consumer electronics at CETEX 2024 in AmsterdamRohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.
27-May-2024 | Press Releases | Test & measurement
Rohde & Schwarz presents its solutions for next generation wide bandgap device test and debug at PCIM EuropeRohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.
29-Jul-2024 | Press Releases
Rohde & Schwarz Expanding EMC Community Capability through their interactive challenge at EMC+SIPI 2024Rohde & Schwarz Expanding EMC Community Capability through their interactive challenge at EMC+SIPI 2024
11-Jun-2024 | Press Releases | Test & measurement
Rohde & Schwarz presents R&S RT-ZISO isolated probing system for precise measurements of fast switching signalsRohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.
17-Jul-2024 | Press Releases | Electronic design
With first ASIC-based zone triggering for MXO oscilloscopes, Rohde & Schwarz breaks acquisition rate recordsRohde & Schwarz introduces the industry’s first ASIC-based zone triggering for the MXO oscilloscope series. It can offer the world’s fastest zone trigger update rate of up to 600.000 waveforms per second and less than 1.45 us blind time between trigger events.
23-Jan-2025 | Press Releases | Test & measurement
Rohde & Schwarz presents R&S ScopeStudio, a PC-based oscilloscope solution to boost development teamsRohde & Schwarz launches R&S ScopeStudio, an innovative application that brings the functionality of the MXO series oscilloscopes to a PC. It allows engineers to visualize, analyze, document and share oscilloscope measurements, making development teams more efficient.
13-Feb-2025 | Press Releases | Test & measurement
Rohde & Schwarz showcases its advanced test solutions for embedded systems at embedded world 2025Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the embedded world, to tackle the emerging challenges in all embedded systems: From energy efficiency and electromagnetic interference to digital design and connectivity.
This document provides the technical specifications of the R&S®RT-Zxx standard probes.
An offline AC/DC switching converter has no separate bias power supply that provides power to the control integrated circuit itself. Here, an auxiliary primary winding and discrete components are added to supply power to the control circuit. Verifying this circuitry is essential and requires accurate and detailed signal level and timing measurements. The startup sequence takes a long time, which needs to be taken into consideration in the measurement and requires an instrument with sufficient memory.
23-Nov-2022
Optimizing electric drivetrains with MXO oscilloscopes
12-Mar-2024
EMI debugging using fast FFT with MXO oscilloscopes
07-Feb-2024
Sometimes auxiliary functions generate emissions infrequently, making it challenging to locate and isolate the root cause. An instrument with a very fast FFT analysis capability is essential to find infrequent events efficiently.
03-Mar-2023