By reference to settings and measurements with a vector network analyzer R&S®ZNA we are demonstrating the de-embedding process of a PCIe5 connector integrated in a test fixture. By reference to settings and measurements with a vector network analyzer R&S®ZNA we are demonstrating the de-embedding process of a PCIe5 connector integrated in a test fixture.

Enhance your knowledge. With the Rohde & Schwarz webinar series on satellite testing.

In this webinar we discuss calibration and uncertainty for angle-of-arrival (AoA) simulation using RF signal generators.

In this final video we look at a special mode of measurements where the ZNA network analyzer can be used to analyze the pulse in time to study in much higher resolution what is happening during the “on time” of the RF pulse. ZNA, Pulse Fundamentals Making pulsed measurements with a vector network analyzer

R&S®ZNA Vector Network Analyzers - Media center

Powerful solutions for testing high-speed digital interfaces: verification ✓ debugging ✓ and compliance testing ► Get more information!

26-Mar-2024 | Press Releases | Test & measurement

Rohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

Calibration of two channels simultaneously with remote commands

I have an existing limit line. Is it possible to apply a vertical offset?

Is there a way to query the data of all traces at once?

Is it possible to automatically restart a ZNB with return of the AC power?

Export complex data of a trace with mathematics and time gating.

03-Sep-2024 | Press Releases | Test & measurement

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.

VNA - do I really need a sliding match for calibration?

Active cal kit or cal unit does not contain all standards needed for selected cal procedure.

Gets you started with the R&S®ZNXSIM Vector Network Analyzer PC Simulation

R&S®ZN-Z1xx Calibration Kits - Specifications

Provides the information required to prepare the instrument for use and start working.

I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?

I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?

I have a file on my device. How can I get it in a simple way to my PC?

How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?

Provides basic information on the calibration kits R&S®ZN-Z170, ZN-Z135, ZN-Z129 and ZN-Z129E.

Here you will find bargains like the latest generation test and measurement instruments which have been used by our sales teams for demonstration, training and loan.

Rohde & Schwarz simplifies the challenging and extensive task of characterizing active components such as RF power amplifiers and RF frontends.

20-Jan-2025 | Press Releases

Rohde & Schwarz, a leading provider of high-performance test and measurement solutions, has announced their plans for the upcoming DesignCon 2025 tradeshow.

For the demanding measurements, the high-end R&S®ZNA vector network analyzer, R&S®ATS800B and R&S®ATS800R compact antenna test ranges (CATR) are used.

21-Mar-2022 | Press Releases | Test & measurement

At DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.

Choose Rohde & Schwarz test solutions for power amplifier efficiency optimization for their dual path signal generation capabilities and ease of results analysis.