Early wafer-level qualification of RF components ensures quality and saves money

14-Jul-2022

On-wafer characterization at sub-THz frequencies

12-Dec-2023

Essential cost consideration

Full RF component characterization using a single RF connection.

10-Nov-2025

Choose Rohde & Schwarz test solutions for power amplifier efficiency optimization for their dual path signal generation capabilities and ease of results analysis.

Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.

Explore RIS with Rohde & Schwarz as one of the most promising key technologies in the future 6G era!

Discover Rohde & Schwarz highlights from European Microwave Week 2025 in Utrecht — with demos and insights into microwave and RF testing innovations.

ZNA, Average Pulse Measurements Making pulsed measurements with a vector network analyzer

ZNA, Point-In-Pulse Measurements Making pulsed measurements with a vector network analyzer

The R&S®ZN-Z86 and R&S®ZN-Z86X switch matrices are designed and optimized for use with the R&S®ZNA, R&S®ZNB and R&S®ZNBT vector network analyzers. They offer a comprehensive, cost-effective total solution for simple to complex measurement tasks on multiport or multiple devices.

ZNA, vector network analyzer Making pulsed measurements with a vector network analyzer

A Fabry-Pérot open resonator (FPOR) provided by QWED allows dielectric sheets to be accurately characterized in the frequency range from 110 GHz to 170 GHz using just one fixture.

14-Jan-2025

This paper investigates the evaluation complexities and importantce of PAM-4 interconnects at high data rates.

22-Oct-2020 | AN-No. GFM355

03-Sep-2024 | Press Releases | Test & measurement

T&M specialist Rohde & Schwarz will present its industry-leading portfolio at European Microwave Week in Paris for various application fields, pushing the limits in the Gigahertz to Terahertz frequency ranges.

20-Jan-2025 | Press Releases

Rohde & Schwarz, a leading provider of high-performance test and measurement solutions, has announced their plans for the upcoming DesignCon 2025 tradeshow.

Learn about the differences between LCR meters and VNAs. Learn how to measure impedance with a network analyzer and how LCR meter impedance measurement works.

This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes.

07-Apr-2021 | AN-No. GFM357

This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes and direct attach copper cables (DAC).

07-Apr-2021 | AN-No. GFM356

Perform interface tests during your USB design process and verify the compliance with USB test solutions from Rohde & Schwarz > Get more information!

19-Jan-2024 | Press Releases

DesignCon 2024 will witness Rohde & Schwarz demonstrate live cutting-edge industry innovations.

Discover optimization aspects of transmission chains in modern satellite designs and how to measure and evaluate the performance of high-gain satellite receivers.

Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.

More: https://www.rohde-schwarz.com/wireless/B5G ThinkSix, B5G, beyond 5G, 6G, sub-terahertz, ATS1000, ZNA, D-Band This video demonstrates the R&S®ATS1000 antenna test system from Rohde & Schwarz, now supporting frequencies up to 170 GHz.

30-May-2024 | Press Releases

Rohde & Schwarz debuts interactive measurement playground at IMS 2024 with solutions from the everyday to the extraordinary

Partner solutions – probe stations

Generating models with a VNA and using these on an oscilloscope via the deembedding

23-May-2023 | AN-No. 1SL393

This document provides the technical specifications of the R&S®ZN-ZCG comb generator.

R&S®ZNx-K100 SNP Assistant - Fact Sheet Brochures and Data Sheets

RPG ZRXxxx Millimeterwave Receiver - Specifications