Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
326 Results
Models: R&S®RTO-K24, R&S®RTP-K24, R&S®RTO6-K24
Models: R&S®RTP-K25, R&S®RTO-K25, R&S®RTO6-K23
This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command and control buses.
30-Oct-2020 | AN-No. GFM340
Analyzing automotive radar signals with an oscilloscope - eGuide - Miscellaneous
Instrument Health Guide For benchtop oscilloscopes - Brochure Brochures and Data Sheets Brochure
Fast Delivery Promotion - Flyer Brochures and Data Sheets Flyer
Models: R&S®RTO-K86, R&S®RTP-K86, R&S®RTO6-K22
Letter of invitation Club of radio engineers
Discover the game changing solution for testing radar-enabled ADAS and AD functions on Vehicle-in-the-Loop testbeds.
Oscilloscope, RTP High-performance oscilloscope, Automotive Radar, Pulse Analysis, Demodulation, Mixer, Downconversion Demodulate radar pulses with built-in oscilloscope functions.
Oscilloscope, RTP High-performance oscilloscope, Automotive Radar, Pulse Analysis, Deembedding, Mixer, Downconversion Deembed mixers and other setup components in realtime.
Oscilloscope, RTP High-performance oscilloscope, Automotive Radar, Pulse Analysis, MIMO, phase-coherant, Mixer, Downconversion Perform phase-coherent measurements on multiple antenna signals.
This document provide the technical specifications of the R&S®FSW-K144/-K145/-K147/-K147C /-K148/-K171/-K175, the R&S®FSV3-K144/-K145/-K147/-K147C/-K148/-K171/-K175, R&S®FPS-K144/-K148 and the R&S®VSE-K144/-K146/-K148/-K171/-K175
This document provides the technical specifications of the R&S®RT-Zxx standard probes.
R&S®Forum for Instrument Remote Control
28-Jun-2018 | AN-No. 1MA196
By using the R&S®RTP oscilloscope instead of a traditional vector network analyzer (VNA), this solution enables wideband modulation characterization of RF frontends across varying impedances. This new test setup is ideal for verifying power amplifier performance when connected to an antenna, which typically shows a dispersive impedance.
Welcome to Rohde & Schwarz webinar How are SI, PI And EMI related to each other.
Get best practices of doing the DDR memory system design verification and debugging with an oscilloscope in our On-demand webinar.
EMI Debugging with the R&S RTO and R&S RTE Oscilloscopes
25-Jun-2014 | AN-No. 1TD05
Buy more - Save more | Customize your oscilloscope configuration and save big - Flyer Brochures and Data Sheets Flyer
RF signal analysis with Rohde & Schwarz spectrum analyzers and oscilloscopes - Application Brochure
The new R&S FE110ST/SR TX/RX frontends extend the frequency range of Rohde & Schwarz signal sources such as the R&S SMW200A vector signal generator and signal analysis instruments such as the R&S RTP oscilloscope to cover the W band from 70 GHz to 110 GHz. They complement the company’s portfolio of easy-to-mount frontends.
This webinar is intended for engineers working on high-speed digital interface designs and testing.
R&S®VISA is a standardized software library that allows fast communications over diverse interfaces with a wide variety of T&M instruments that are detected on the network from PC applications.
26-May-2020 | AN-No. 1DC02
As DisplayPort evolves to support ultra-high resolutions and increased data rates, robust compliance testing is essential to ensure interoperability across devices and interconnects. This application note provides a structured overview of physical-layer testing for DisplayPort source transmitters and passive cables, aligned with VESA CTS v2.1. The note covers key test procedures using Rohde & Schwarz solutions, including oscilloscope-based measurement at standardized test points, automated test execution with ScopeSuite, and signal integrity debug via equalization and jitter decomposition. It further details cable characterization using mixed-mode S-parameter analysis on a Vector Network Analyzer (VNA), with support for simulated eye diagrams and TDR-based impedance diagnostics. Practical setup examples and product references are provided to help engineers perform repeatable, standards-compliant DisplayPort PHY validation.
16-Jul-2025 | AN-No. 1SL418
MIPI D-PHY is a low-power, cost-effective physical layer interface, essential in mobile devices and advanced technology systems. It's a high-speed, source-synchronous interface used in smartphone cameras, smartwatch displays, drones, in-car entertainment, automobile cameras, and radar sensors. This application note explores MIPI D-PHY's features, functionality, and testing practices for device compliance, addressing common issues. It highlights Rohde & Schwarz's equipment for ensuring compatibility and solving issues with MIPI D-PHY, aligned with MIPI D-PHY specification version 2.5.Developed by the MIPI Alliance, D-PHY connects cameras and displays to a host processor via CSI-2 or DSI protocols. It features a master-slave, asymmetrical design for reduced link complexity. Key aspects include a unidirectional clock, optional data signal directions, different data rates for half-duplex operation, point-to-point communication, and high-speed (HS) and low-power (LP) modes for data transfer and battery preservation. In HS mode, D-PHY uses differential signaling with specific impedance, while in LP mode, it operates in a single-ended manner with high impedance termination.The application note from Rohde & Schwarz provides insights into characterizing and debugging MIPI D-PHY, offering conformance verification with MIPI Alliance standards and protocol decoding options.
31-Jan-2024 | AN-No. 1SL410
Generating models with a VNA and using these on an oscilloscope via the deembedding
23-May-2023 | AN-No. 1SL393
This app note provides an introduction into the various jitter components and elucidates the commonly available jitter separation frameworks.
08-Dec-2021 | AN-No. 1SL375
Testing the world’s first quantum error correction stack