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Characterizing wideband active RF components using real-world stimulus signals

Florian Ramian, DSP Development, Rohde & Schwarz

The obvious way of testing components is to set them up in an environment as close to the real-world environment as possible. Time and cost constraints during testing are the limiting factors in this context. This presentation discusses the advantages of using a fully modulated signal versus different approaches to speed up the testing process. It focuses specifically on non-linear devices, such as PAs. Measurement metrics such as EVM are compared and correlated to traditional metrics such as NPR.