Modern phased arrays require over-the-air testing in far-field conditions. As the number of elements increases, so do the OTA and cable losses in direct far-field setups, because of the longer far-field distance. Future dual-polarized phased arrays will integrate frequency-converting ICs, necessitating 5-port phased coherent measurements for calibration (unless they are calibration-free like the Fujikura PAAM) and verification.

Join experts from Rohde & Schwarz and Fujikura as they address the challenges of testing future phased arrays. The device under test is Fujikura's highly integrated FutureAccess™ mmWave phased array antenna module (PAAM). For the demanding measurements, the high-end R&S®ZNA vector network analyzer, R&S®ATS800B and R&S®ATS800R compact antenna test ranges (CATR) are used.

You will learn:

• Beamforming challenges and design features for calibration-free phased arrays
• Tradeoffs in creating far-field conditions and basics of CATR
• The challenges of 5-port vector network analysis for phased arrays with frequency converters

The performance of Fujikura's PAAM, demonstrated through multiple OTA CATR tests, including:

• Phase-coherent ZNA power sweeps
• Radiation patterns
• Combined power and tapering
• Independent phase and gain control
• Temperature stability
• Beam switching