Test challenges for de-embedding and interconnect testing in data centers

This session discusses challenges in high-speed cable testing, focusing on accurate test fixture characterization, de-embedding techniques, and the importance of impedance-corrected de-embedding.

Request information

Do you have questions or need additional information? Simply fill out this form and we will get right back to you.

First name

Last name

E-mail

Company

Country

Phone (e.g. +1 400 123 5678)

Zip

City

Inquiry

Email confirmation (optional)

Your request has been sent successfully. We will contact you shortly.

An error is occurred, please try it again later.

Test challenges for de-embedding and interconnect testing in data centers

Welcome to PLUS content