• {dl}
    {dnn}
  • {hl}
    {hnn}
  • {ml}
    {mnn}
  • {sl}
    {snn}

Measure the impossible

Discover signals once out of reach

Witness the debut of a game-changing analyzer that will overcome the limitations of today’s measurement methods. With a novel architecture that combines multiple input ports with cross-correlation techniques, the analyzer allows for completely new measurement scenarios in RF system testing. Join our signal analysis revolution with wider modulation bandwidths and higher modulation orders to conquer your requirements for ever-increasing data rates.

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Measure the impossible!
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Logo of IMS
Logo of IMS
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San Francisco | IMS 2025

Join us at International Microwave Symposium (IMS)

Talk to our experts to get more insights.

Visit our booth and experience this analyzer revolution for yourself.

Where: Moscone Center, San Francisco, CA
Booth: 1443
When: June 17-19, 2025

Featured signal and spectrum analysis resources

Article: Overcoming the Limitations of Modern Signal and Spectrum Analyzers - A Look into the Future

Article: Overcoming the Limitations of Modern Signal and Spectrum Analyzers - A Look into the Future

Article published in May 2025 issue of Microwave Journal Magazine, Author: Dr. Wolfgang Wendler, Product Management Signal and Spectrum Analyzer at Rohde & Schwarz

Current signal and spectrum analysis faces numerous challenges, as modern RF applications demand ever-increasing data rates, wider modulation bandwidths and higher modulation orders.

Learn about:

  • New instrument architecture for new measurement possibilities
  • Cross-correlation techniques for better phase noise measurements
  • Finding hidden spurs quickly

More information

Podcast: The future of signal and spectrum analysis with expert advice from Rohde & Schwarz

Podcast: The future of signal and spectrum analysis with expert advice from Rohde & Schwarz

Microwave Journal Podcast with Rohde & Schwarz signal and spectrum analysis experts Darren Tipton and Dr. Wolfgang Wendler

Wolfgang Wendler, Product Manager, and Darren Tipton, Director of Product Management, at Rohde & Schwarz talk with Pat Hindle and Del Pierson about the challenges facing signal and spectrum analysis instruments and some solutions to solve emerging measurement problems for various applications.

More information

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