As wireless and sensing technologies push into the sub-terahertz (sub-THz) spectrum (100–300 GHz), engineers face both immense opportunity and significant technical challenges. This frequency range offers unprecedented potential for high-data-rate communications, advanced radar systems, imaging, and other cutting-edge applications—but also demands innovation in device design and characterization. Operating at sub-THz frequencies introduces unique complexities, including increased path loss, atmospheric attenuation, and the need for highly precise component optimization. Advanced measurement techniques such as load pull are essential to navigating these challenges. By systematically varying the impedance environment of a device under test (DUT), load pull enables engineers to gain deep insight into device behavior and optimize performance for efficiency and reliability. In this webinar, we’ll explore how High-Power Active Load Pull Measurements are driving breakthroughs in sub-THz component development. Attendees will learn how these techniques help overcome technical barriers and accelerate innovation across a range of emerging high-frequency applications.