RF Testing Innovations Forum 2025 | Virtual Event

Date

On-demand

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Online

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Language: English
Free of charge

Virtual event

Elevate your RF Expertise

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RF Testing Innovations Forum 2025 is dedicated to RF design engineers where they will gain invaluable insights into the latest advancements in testing methodologies and technologies.

Experts from Rohde & Schwarz and industry partners will explore critical topics shaping the future of RF testing. You will delve into the evolution of Vector Network Analyzers (VNAs), enhancing the accuracy of mm-wave non-linear vector analyzers, and addressing the challenges of on-wafer characterization for BAW filter harmonics.

You will also discover innovative approaches to wideband modulated load pull and learn how to accelerate antenna pattern analysis and simulation using MATLAB. The forum will highlight the importance of stable and highly accurate test levels through closed-loop power control, while rethinking beamforming strategies for more efficient implementations. Additionally, advanced measurement techniques for ultra-wideband software-defined radios will be discussed, equipping engineers with the knowledge to tackle emerging challenges in RF design and testing.

Don’t miss this opportunity to enhance your expertise and network with industry leaders at the forefront of RF innovation.

Register now to access all videos on-demand!

Opening Keynote with Michael Fischlein

Vice President Spectrum & Network Analyzers, EMC and Antenna Test Equipment, Rohde & Schwarz

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Improving the accuracy of a mm-wave non-linear vector analyzer

Roberto Quaglia, Senior Lecturer and Group Leader of the Centre for High Frequency Engineering, University of Cardiff

This presentation discusses a world-first source-load pull system centred around the R&S®ZVA vector network analyser and 110 GHz passive tuners. The calibration procedure is described highlighting possible critical steps and the solutions adopted to improve the confidence in the measurement results. A load-pull based vector calibration to enhance the accuracy at high VSWR is presented, showing significant impact on transistor measurements at E-band.

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Wideband modulated load pull

Luca Gragnaniello, Product Manager Oscilloscopes, Rohde & Schwarz

In this presentation, we will explain the advantages of the new wideband modulated load pull solution from Rohde & Schwarz, which addresses these limitations with a novel approach to RF frontend testing. By using the R&S®RTP oscilloscope instead of a traditional vector network analyzer (VNA), this solution enables wideband modulation characterization of RF frontends across varying impedances. This new test setup is ideal for verifying power amplifier performance when connected to an antenna, which typically shows a dispersive impedance.

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Stable and highly accurate test levels thanks to closed loop power control

Frank-Werner Thümmler, Product Manager Signal Generator, Rohde & Schwarz

This session will discuss how to ensure highly accurate and stable input power over time to the test device. We will discuss how the closed loop power control in combination with an R&S®NRP power sensor is leveling out unexpected signal chain losses or gains, unwanted power drifts in the setup or target level changes. Participants will learn about supported signal forms, suitable test instrumentation and what needs to be taken into account to get best results.

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Exploring Load Pull Techniques for Next-Generation Sub-THz Components

Giampiero Esposito, Business Development Manager, Solutions Architect, Maury Microwave, Inc.

As wireless and sensing technologies push into the sub-terahertz (sub-THz) spectrum (100–300 GHz), engineers face both immense opportunity and significant technical challenges. This frequency range offers unprecedented potential for high-data-rate communications, advanced radar systems, imaging, and other cutting-edge applications—but also demands innovation in device design and characterization.

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Characterizing wideband active RF components using real-world stimulus signals

Florian Ramian, DSP Development, Rohde & Schwarz

The obvious way of testing components is to set them up in an environment as close to the real-world environment as possible. Time and cost constraints during testing are the limiting factors in this context. This presentation discusses the advantages of using a fully modulated signal versus different approaches to speed up the testing process. It focuses specifically on non-linear devices, such as PAs. Measurement metrics such as EVM are compared and correlated to traditional metrics such as NPR.

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Keynote: Evolution in VNAs – Interview with Dr. Benoît Derat, Senior Director VNA R&D

Benoît Derat Senio, Director VNA R&D, Rohde & Schwarz
Markus Lörner, Market Segment Manager RF Components

RF components are becoming more sophisticated, integrated with more features and offer unseen performance and frequency coverage. Thus, RF measurements become more challenging asking for faster and more accurate test solutions while they need to be more cost efficient. We will discuss with Senior director of Vector Network Analyzer development, Dr. Benoît Derat, how Rohde & Schwarz will address these challenges.

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Challenges of on-wafer characterization of BAW filter harmonics

Susanne Kreuze, Member of Technical Staff, BAW R&D, Qorvo

The constant demand for continuing RF module and thus bulk acoustic wave (BAW) filter size reduction results in the need of accurate design characterization strategies to comply with ever more stringent linear and non-linear product specification requirements. While the target performance of a design is very precisely predicted by simulation, wafer level testing of BAW filters is required to screen for outlier parts in production.

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Accelerating antenna pattern analysis and simulation with MATLAB

Giorgia Zucchelli, Product Manager for RF and MIXED-SIGNAL, Mathworks

Characterizing and measuring antennas and antenna arrays can be a time-consuming and error-prone task, particularly when working with highly programmable phased array systems. In this presentation, discover how MATLAB can streamline the antenna characterization, including processing S-parameters and far-field radiation patterns. Focus is put on building the full 3D radiation pattern from a subset of 2D pattern measurements using both analytical methods and AI techniques. Additionally, learn how to integrate the measured data into a systemlevel simulation model for wireless communication and radar systems.

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Dataset Acquisition Optimization for AI-controlled electronically steerable antennas

Dr Sana Abid, R&D Engineer, Greenerwave

Using RIS based on simple off-the-shelf electronic components to develop cost-effective and powerefficient products, we will show how Greenerwave masters the shift of complexity from hardware to software by leveraging AI-driven physical model. Indeed, the acquisition of a large database necessary for AI models training represents a true technical challenge since it requires a sufficiently high volume of data ; in Greenerwave antenna concept, the required input data scales quadratically with the system dimension.

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Advanced Measurement Techniques for Ultra-Wideband Software Defined Radios

Kate Berry, Applications Engineer, Advanced Data Converters, Analog Devices
Jon Hall, Marketing Manager, Advanced Data Converters, Analog Devices

Join us for an insightful session where we delve into the cutting-edge world of ultra-wideband software defined radios (SDRs) with a focus on the measurement challenges of the transmit and receive signal paths of the Analog Devices Apollo MxFE™ platform.

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Fast forward in RFFE production – the R&S®ZNB3000 vector network analyzer

Yassen Mikhailov, Product Manager Vector Network Analyzer, Rohde & Schwarz
Wojciech Kuropatwinski-Kaiser, Application Engineer for Network Analyzers, Rohde & Schwarz

Looking at a production test case for RF frontends, we will show how you will accelerate throughput. The presentation introduces the new midrange family of vector network analyzers – the R&S®ZNB3000 followed by a live demonstration of single connection device characterization. The live demonstration will highlight the seamless integration between the R&S®ZNB3000 and the R&S®ZN-Z86 matrix to address test requirements for high volume RF frontend and other RF component production.

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Rohde & Schwarz presenters

Michael Fischlein, Vice President Spectrum and Network Analyzer, EMC & Antenna Test at Rohde & Schwarz

Michael Fischlein is Vice President Spectrum & Network Analyzers, EMC and Antenna Test Equipment at Rohde & Schwarz. Previously, he served as Senior Director Network and Economy Analyzers, leading the research and development team. From 2000 until 2018 he held various positions in test and measurement at Rohde & Schwarz, initially in analog design of RF frontends, followed by a role as project leader for several economy products.

Luca Gragnaniello, Product Manager Oscilloscopes at Rohde & Schwarz

Dr. Luca Gragnaniello works as a Product Manager for Oscilloscopes, with a focus on RF applications. He joined Rohde & Schwarz in 2022, after several years of experience in Product Management and Development for Scientific Instrumentations, carrying also a deep academic background, thanks to seven years as a scientific researcher in renowned European universities. Luca holds a Diploma in Physics and a PhD in Nanoscience and Nanotechnology.

Frank-Werner Thümmler, Product Manager Signal Generator at Rohde & Schwarz

Frank-Werner Thümmler got his master degree for electrical engineering at the Technical University of Karlsruhe. He worked from 1994 to 1999 as a product manager for Siemens Matsushita and joined Rohde&Schwarz in 1999. He is responsible for analog signal generators.

Dr. Benoît Derat, Senior Director VNA R&D at Rohde & Schwarz

Benoît Derat received the engineering degree from SUPELEC in 2002 and a Ph.D. degree in physics from University of Paris XI with honors in 2006.

From 2002 to 2008, he worked at SAGEM Mobiles, as an antenna design and electromagnetics research engineer. In 2009, he founded ART-Fi, which created the first vector-array SAR measurement system. Dr. Derat operated as the CEO and President of ART-Fi, before joining Rohde & Schwarz in Munich in 2017. He is now working as Senior Director for VNA R&D. Dr. Derat is the author of more than 80 scientific conference and journal papers, as well as an inventor on more than 30 patents.

Florian Ramian, DSP Development at Rohde & Schwarz

Florian Ramian is a Development Engineer at Rohde&Schwarz, primarily focusing on the analysis of non-linear DUTs. Florian has 20 years of experience as an RF engineer including R&D for automotive radars as well as 15+ years of test and measurement experience. Before moving into R&D he held several positions as an Application Engineer for R&S Spectrum & Signal-Analyzers and Researcher at TU München. He received his Dr.-Ing. and Dipl.-Ing. degrees both from Technische Universität München.

Yassen Mikhailov, Product Manager Vector Network Analyzer at Rohde & Schwarz

Yassen Mikhailov holds a BS degree in Systems Engineering from US Naval Academy and a MS degree in Telecommunications from the University of Maryland. He began his career as an RF Engineer at Aeronautical Radio Inc (ARINC now part of Rockwell Collins) and joined R&S in 2007. Yassen has held various positions at R&S, currently responsible for latest generation of midrange vector network analyzers.

Portrait image of Wojciech-Kuropatwinski-Kaiser

Wojciech Kuropatwinski-Kaiser, Application Engineer for Network Analyzers at Rohde & Schwarz

Wojciech Kuropatwinski-Kaiser graduated at Technical University in Karlsruhe. He joined R&S in 2006 and participated in FPGA development of different R&S instruments like Oscilloscopes, Body scanners, Spectrum and Network analyzers. Since 2021 he has been working as an application engineer for Network analyzers.

Partners presenters

Roberto Quaglia, Senior Lecturer and Group Leader of the Centre for High Frequency Engineering at University of Cardiff

Roberto Quaglia received his PhD from Politecnico di Torino, Torino, Italy. After a short spell in Industry, he joined Cardiff University, UK, in 2015 with a European Fellowship. He is now a Senior Lecturer and the Group Leader of the Centre for High Frequency Engineering. His research focusses on design, characterisation and modelling for microwave and mm-wave power amplifiers.

Giampiero Esposito, Business Development Manager, Solutions Architect at Maury Microwave, Inc.

Giampiero Esposito is the Business Development and Product Line Manager at Maury Microwave Corporation and is responsible for product line successes including market intelligence, sales enablement, planning, development, and lifecycle management of products.

He joined the company in October 2012, as an application engineer responsible for product support and has since held various technical, management positions within the company.

Giampiero received the B.E and M.S degree in 2009 in Electrical Engineering from the University of Naples, Italy with an emphasis in RF Microwave. His thesis was performed at University of Delft, the Netherlands, where he developed new techniques for noise parameters characterizations.

Susanne Kreuzer, Member of Technical Staff, BAW R&D at Qorvo

Susanne Kreuzer studied physics at the Johannes Kepler University (JKU) in Linz, Austria, winning the Wilhelm Macke award for the best master thesis in 2012. She joined Qorvo’s bulk-acoustic wave (BAW) R&D team in Apopka, Florida, in 2013, currently works as member of technical staff and recently transitioned to Qorvo Austria in 2025. She earned a Ph. D. from JKU, Linz in 2021 for her research on improvement of non-linearities in BAW.

Susanne also has experience with optical and RF setups, focusing on material property characterization and device physics, and studying process variation effects on BAW filter performance using interferometry and electrical data. She published various papers in the field of BAW filters and is the first author of 3 patents.

Giorgia Zucchelli, Product Manager for RF and mixed-signal at Mathworks

Giorgia Zucchelli is the product manager for RF and mixed-signal at MathWorks. Before moving to this role in 2013, she was an application engineer focusing on signal processing and communications systems and specializing in analog simulation. Before joining MathWorks in 2009, Giorgia worked at NXP Semiconductors and at Philips Research. Giorgia has a master’s degree in electrical engineering and a doctorate in electronics for telecommunications from the University of Bologna.

Dr. Sana Abid, R&D Engineer at Greenerwave

Sana Abid is an emerging Lab Coordinator and R&D Engineer at Greenerwave in Paris, with a background in microwave imaging, signal processing, and electromagnetic instrumentation.

Currently working as responsible for the management of radio frequency laboratory activities, ensuring efficient experimental operations, coordination of technical and scientific teams. Her position is crucial in supporting innovation and contributing to high-tech research projects.

Previously, she contributed to the development of microwave radar imaging methods for automotive applications.

Sana holds a PhD in Electronics and computer science from the XLIM Research Institute (University of Limoges, France), where her research focused on computational interferometric imaging using a chaotic cavity as an analog coding device. This work aimed to reduce the cost and complexity of imaging systems, with experimental validations conducted in the millimeter-wave band.

Kate Berry, Applications Engineer, Advanced Data Converters at Analog Devices

Kate Berry is an applications engineer in the Advanced Data Converter group at Analog Devices. She received her B.S. in mechanical engineering from Yale University and her M.S. in computer engineering from the University of Massachusetts Lowell. She has worked at ADI for 3 years supporting wideband DACs, ADCs, and transceivers with a specific focus on instrumentation markets and synchronization.

Jon Hall, Marketing Manager, Advanced Data Converters at Analog Devices

Jon Hall is a Senior Principal Engineer in the Advanced Data Converter Group at Analog Devices, boasting over 36 years of experience in the semiconductor industry. He holds a B.S. in Chemical Engineering and an M.B.A. with concentrations on Marketing and Operations Management from the University of Rochester. With more than 26 years at Analog Devices Inc., Jon has led cross-functional development teams within the Aerospace, Defense and Communications business unit, focusing on new product definitions, technical applications support, go-to-market releases, business development, and strategic planning.